Agilent Technologies Agilent 35670A manual AGILENT 35670A Supplemental Operator’s Guide

Models: Agilent 35670A

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AGILENT 35670A

Supplemental Operator’s Guide

Section 18 : Measuring Frequency Response with the AGILENT 35670A

Frequency response functions characterize the behavior of systems to external stimuli. For mechanical systems, the stimulus can be a transient force such as an impact from a hammer, or a broadband stimulus, such as random excitation from an electrodynamic shaker. The response is usually motion of the system, measured with and accelerometer, velocity transducer, or displacement probe.

In either case the stimulus and the response measured with two channels of the AGILENT 35670A. The stimulus is usually measured on Channel 1, and the response is measured on Channel 2. The resulting frequency response is averaged to reduce noise and variance, and the result is displayed in a variety of formats that will be described in this section, including:

Magnitude and phase

Real and imaginary components (

Nyquist Diagrams

The quality of the frequency response measurement is determined by how much of the response is due to the stimulus instead of being due to noise or other undesirable, unmeasured forces. Quality is described by coherence, which ranges from zero to one, where zero means none of the response is due to the stimulus. A coherence of one means that the response was entirely due to the stimulus

Measuring Frequency Response Using Impact Excitation

Refer to the section “Modal Testing Using a Hammer and Accelerometer” to measure frequency response using an impact as a stimulus. An impact provides broadband excitation, however the impact has a high peak to RMS ratio which tends to reduce measurement quality.

Measuring Frequency Response Using Broadband Excitation

Excite a system using the AGILENT 35670A built-in source to provide broadband excitation with low peak to RMS ratio and the best measurement quality. Use burst- random noise to eliminate window distortion and reduce leakage. The following instructions show how to set up a modal test with these example parameters:

electrodynamic shaker with amplifier

ICP force transducer with sensitivity of 8 mV/lb. ICP accelerometer with sensitivity of 10.2 mV/G wire sting to connect shaker to force transducer burst random excitation, uniform window frequency span of 800 Hz, 4 averages results viewed as log magnitude and phase

Set up the shaker

Attach force transducer to structure

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Page 54
Image 54
Agilent Technologies Agilent 35670A manual AGILENT 35670A Supplemental Operator’s Guide