Agilent Technologies Agilent 35670A manual Changing Frequency Span

Models: Agilent 35670A

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Changing Frequency Span

AGILENT 35670A

Supplemental Operator’s Guide

Changing Frequency Span

Changing frequency span or resolution affects three important parameters in hammer testing which must be changed to correspond to the new time record length: Trigger Delay, Force Window Width, and Response Window Decay Time. The following relationship between the parameters can be used as a guideline:

T= N (1024.F )

Where T is the time record length in seconds, N is the resolution in lines, and F is the frequency span in Hz.

Delay = 01.(T)

ForceWidth = T 7

ExponentialDecay = T 4

When the frequency span is halved, the Time Record length doubles, as does the Delay time, Force Width, and Exponential Decay. All three parameters should change with the inverse of the change in frequency span.

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Agilent Technologies Agilent 35670A manual Changing Frequency Span, Delay = 01.T ForceWidth = T ExponentialDecay = T