Index
Index-11
swept edit list menu, 7-17
swept edit subsweep menu, 7-17
swept list mode
calibrate, 1-70
characteristics of the filter, 1-68
device under test, connect, 1-67
measure, 1-70
measurement parameters, 1-68
stepped list mode, 1-67
to test a device, 1-67
swept list mode, using, 5-10
swept RF/IF conversion loss, hig h
dynamic range, 2-20
switch protection, source
attenuator, 7-13
SWR format, 7-28
SWR/return loss, 2-50
synthesized source, built-in, 7-3
system
bandwidth, changing, 5-16
bandwidth, widening, 5-12
system controlle r mode, 7-79
system operation, 7-3
built-in synthesized source, 7-3
built-in test set, 7-4
microprocessor, 7-4
receiver block, 7-4
required peripheral equipment,
7-4
systematic errors, 7-41
T
taking care of microwave
connectors, 5-3
talker/listener mode, 7-79
target amplitude, searching for,
1-40
temperature drift, 5-5
terminology, TRL, 7-68
test
bandwidth, 1-92–1-97
ripple limit, 1-81–1-91
test port coupling, 7-10
test port input power, increasing,
5-15
test sequencing, 1-98
changing the sequence title,
1-103
clearing a sequence from
memory, 1-102
creating a sequence, 1-98
editing a sequence, 1-100
generating files in a loop counter
example, 1-116
in-depth sequencing
information, 1-105
inserting a command, 1-101
limit test example sequence,
1-118
loading a sequence from a disk,
1-104
loop counter example sequence,
1-115
modifying a command, 1-101
naming files generated by a
sequence, 1-103
printing a sequence, 1-105
purging a sequence from a disk,
1-104
running a sequence, 1-100
stopping a sequence, 1-100
storing a sequence on a disk,
1-104
using to test a device, 1-114
test set, built-in, 7-4
testport output power, 5-7
text file, saving measurements as
a, 4-44
thru, manual, 6-60
time delay, decreasing, 5-9
time domain bandpass mode, 3-4,
3-12
adjusting the relative velocity
factor, 3-12
reflection measurements using
bandpass mode, 3-12
transmission measurements
using bandpass mode, 3-14
time domain low pass impulse
mode, 3-4
time domain low pass mode, 3-15
fault location measurements
using low pass, 3-18
minimum allowable stop
frequencies, 3-16
reflection measurements in time
domain low pass, 3-16
setting frequency range for time
domain low pass, 3-15
transmission measurements in
time domain low pass, 3-19
time domain low pass step mode,
3-4
time domain measurements,
introduction, 3-3
forward transform mode, 3-4
time domain bandpass mode,
3-4
time domain low pass impulse
mode, 3-4
time domain low pass step
mode, 3-4
time stamp, 4-33
title, 1-106
title, display, 1-11
titling the displayed
measurement, 4-32
to produce a time stamp, 4-33
trace math operation, 7-7
trace noise, reducing, 5-16
tracking, 7-41
tracking the amplitude, 1-41
tracking, ampli tude and phase,
2-39
transform, 7-8
transforming CW time
measurements into the
frequency domain, 3-22
forward transform
measurements, 3-22
transmission measurements in
time domain low pass, 3-19
interpreting the low pass step
transmission response
horizontal axis, 3-20
interpreting the low pass step
transmission response
vertical axis, 3-20
measuring separate
transmission paths th r oug h
the test device using low
pass impulse mode, 3-20
measuring small signal
transient response using
low pass step, 3-19
transmission measurements
using bandpass mode, 3-14
interpreting the bandp ass
transmission response
horizontal axis, 3-14
interpreting the bandp ass
transmission response
vertical axis, 3-14
transmission measurements,
response and isolation error
correction, 6-17
transmission measurements,
response error correction,
6-14
transmission response
measurements, making, 3-5
TRL calibration, performing, 6-52
TRL error correction
assigning standards to v arious
TRL classes, 6-51
label the calibration kit, 6-51
label the classes, 6-51
performing the TRL calibration,
6-52
TRL error-correction, 6-50