Index
Index-5
improving raw source match and
load match for TRL*/LRM*
calibration, 7-71
increase sweep speed
using fast 2-port calibration,
5-13
increasing dynamic range, 5-15
increasing test port in put power ,
5-15
reducing receiver crosstalk, 5-15
reducing the receiver noise floor,
5-15
increasing measurement
accuracy, 5-4
connector repeatability, 5-4
frequency drift, 5-5
interconnecting cables, 5-4
performance verif ication, 5-5
reference plane and po rt
extensions, 5-5
temperature dri ft, 5-5
increasing sweep speed, 5-10
activating chop sweep mode,
5-13
decreasing the frequency span,
5-11
reducing the averaging factor,
5-12
reducing the number of
measurement points, 5-12
setting the auto sweep time
mode, 5-12
setting the sweep type, 5-12
using external calibration, 5-13
using swept list mode, 5-10
viewing a single measurement
channel, 5-13
widening the system bandwidth,
5-12
increasing test port input power,
5-15
incrementing the source
frequencies, 2-32
in-depth sequencing information,
1-105
autostarting sequences, 1-106
commands completed before
next sequence begins, 1-105
commands that require a clean
sweep, 1-106
decision making functions,
1-112
embedding loop counter value in
title, 1-106
features that operate differently
in a sequence, 1-105
forward stepping in edit mode,
1-106
gosub sequence command, 1-107
GPIO mode, 1-107
limit test decision making,
1-112
loop counter decision making,
1-113
sequence decision making
menu, 1-112
sequence size, 1-106
sequence that jumps to itsel f,
1-112
sequencing special function s
menu, 1-112
titles, 1-106
TTL I/O menu, 1-108
TTL input decision making,
1-108, 1-112
TTL out menu, 1-112
TTL output for controlling
peripherals, 1-108
indicators, GPIB STATU S, 7-79
initializing loop counter value to
26, 2-30
input ports menu, 7-23
inserting a command, 1-101
insertion phase response, 1-7, 1-8
instrument markings, 8-4
instrument modes, 7-84
frequency offset operation, 7-85
network analyzer mode, 7-84
tuned receiver mode, 7-84
instrument state
file, deleting, 4-52
files, 4-47
re-saving, 4-51
saving, 4-38, 7-65
saving and recalling, 4-36
interconnecting cables, 5-4
internal memo ry, 4-36
internal R channel inputs, 2-10
interpolated error correction, 6-8
interpolation in power meter
calibration, 6-34
interpreting
bandpass reflection response
horizontal axis, 3-13
bandpass reflection response
vertical axis, 3-13
bandpass transmission respons e
horizontal axis, 3-14
bandpass transmission respons e
vertical axis, 3-14
forward transform horizontal
axis, 3-23
forward transform vertical axis,
3-22
low pass response horizo ntal
axis, 3-16
low pass response vertic al axis,
3-16
low pass step transmiss ion
response horizontal axis,
3-20
low pass step transmiss ion
response vertical axis, 3-20
introduction to time domain
measurements, 3-3
isolation, 7-40, 7-69
averaging, 6-61
calibrating using ECal, 6-61
calibration, omitting, 6-4
error corrections and frequency
response, 6-17
isolation example measurements,
2-45
LO to RF isolation, 2-45
RF feedthrough, 2-47
SWR/return loss, 2-50
J
jpeg files, saving results as, 4-46
K
knowing the instrument modes,
7-84
L
labeling the screen, 2-32
leakage signals, eliminating
unwanted, 2-6
limit line operation, 7-82
edit limits menu, 7-83
edit segment menu, 7-83
offset limits menu, 7-83
limit lines
creating flat limit lines, 1-73
creating single point limits, 1-77
editing line segments, 1-78
measurement parameters, 1-72
offsetting limit lines, 1-79
running a limit test, 1-79
sloping limit line, 1-75
using to test a device, 1-72
limit test
decision making, 1-112
example sequence, 1-118
limit test, running, 1-79
activating the limit test, 1-79
reviewing the limit line
segments, 1-79