Agilent Technologies FS2331 user manual

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Because strobe edges are centered on the data valid window for writes, and straddle it for reads, the analyzer cannot simply use the raw DQS0 to sample data. If it did, then even in the ideal case, only half of the data valid window would be usable. In practice, it would almost completely disappear. To deal with this, the DDR Probe adjusts the timing of DQS0 before sending it to the analyzer state clock input by delaying it a fixed amount for reads. This is done using a socketed delay line, which is set at the factory and should be sufficient. If EyeFinder results show good eyes when the probe is set to pass Reads only and Writes only (SW #6 off), but the eyes are significantly reduced when the probe passes BOTH Reads and Writes (SW #6 on), then the delay value on the probe may need adjustment. The calibration procedure documented in this User Manual describes how to set the probe delay line and analyzer sample position for reliable state analysis operation.

Because the strobes are tristated between bursts their logic value is undefined. Some systems will terminate the DDR bus to a voltage close to the Vref voltage, causing the strobes to sit right at the switching threshold. During read bursts, because read data (and strobes) are actually not valid until the reflected wave reaches the probe, DQS0 may also spend a significant amount of time at Voh/2 (close to Vref) between arrival of the incident wave and the reflected wave. Therefore, simply comparing the DQS0 signal to Vref will result in spurious analysis clocks being generated between bursts and during read bursts. The DDR probe deals with these factors by recognizing valid DQS0 edges only when they are closer to Vih than Vref as well as by inhibiting the state clock between bursts. In actual operation enough noise immunity is added by the special DQS0 receiver circuit to eliminate almost all spurious data strobes without inhibiting the clock.

All of these factors combine to add jitter to the read and write strobes sensed by the DDR probe. This jitter reduces the data valid window available to the logic analyzer. In some systems and DIMM configurations that have tight bus timing this may make it difficult to find an appropriate point to sample state data. This is especially true for read bursts that usually have more complex strobe and data waveforms. Eye Finder will measure the data valid window available to the analyzer for each signal and clearly indicate which ones may have difficulty reliably sampling state data given actual DDR bus timing.

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Contents DDR Sdram Analysis Probe FS2331 RevisionHow to reach us Product Warranty Signal Connections For Technical Support For Sales and Marketing SupportLimitation of warranty Product WarrantyExclusive Remedies Definitions Probe Cable, Connector NumberingIntroduction Logic Analyzer ModulesFS2331 100 pin Connector to Pod Diagram FS2331 Probe Description Probe Feature SummaryProbe Components State Clock Generation DDR CommandsProbe Design DDR DataPage Probe Pod Assignment Pod Clock Domain Clock RateProbe Switch Settings Switch # Default factory Function PositionOn closed Connecting the Probe to the Logic Analyzer Logic Analyzer Signal Threshold Voltage SettingsConnecting Power to the FS2331 Probe Card Requirements for PC2700 Systems 16753/4/5/6 Logic Analyzer Card RequirementsRecommended Software Requirements System Software Setting up the 167xx AnalyzerSetting up the 169xx Analyzer 169xx LicensingTiming Analysis All DDR speeds and supported analyzer cards Card Configurations for State Analysis Probing multiple DDR busses Interleaved memory Connecting to your Target System Chip Select If User is dedicating aChip Select Jumper locations § Isolate the Dedicated DIMM’s pin§ Sleeve the Pin § Wire from the adjacent Dimm slot to the isolated pin Unused PodsOffline Analysis Filtering State Analysis Operation Loading the Inverse Assembler and Decoding DDR CommandsTiming Analysis Operation Taking a Trace, Triggering, and Seeing Measurement ResultsInverse Assembler and Decoding DDR Commands Tracing the Serial Presence Detect Signals Using Eye Finder with the FS2331 DDR Probe Using EyeScan with the FS2331 Probe Using the FS2331 DDR Probe with an Interposer FS1024/25 Dimm Signal Loading OptionFS2331 Calibration Page Set Command sample position Page Page Write Burst Data Valid Position Page Page Page Read Burst Data Valid Position Page Page Page Adjust the delay line value to maximize R/W overlap Set the final analyzer sample positionPage General Information Standards supportedSignal Connections J1 Data SamtecSA0 J2 Data and Command CB4Spare J3 Command and Data Buffcmdclk J4 Data DM5DQS14DQS7