Agilent Technologies FS2331 Probe Design, State Clock Generation, DDR Commands, DDR Data

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Probe Design

This probe uses discrete ECL logic in order to operate at the speed necessary to provide DDR333 signal decode. Because ECL logic operates in linear mode it dissipates more heat than other logic designs.

BE ADVISED – THE PROBE IS HOT TO THE TOUCH. . If the user believes that the FS2331’s temperature is above 80°C, then a fan should be used to provide additional cooling.

In order to support source synchronous data capture the FS2331 DDR probe monitors the clock (CK0/CK0n) and control (DQS0, CAS, RAS, WE, S0:3) signals on the DIMM connector where the probe is inserted. In some cases the probe may also need access to the chip select signals for other DIMM slots to enable source synchronous data capture. There may be situations where these signals are not provided by the target system. For instance, some systems may turn off CK0 to slots where no DIMM module is detected. In other systems, the unique Chip Select signals for each DIMM may need to be connected to the probe.

If there is any reason to suspect that these conditions are present on your target, contact FuturePlus Technical Support.

State Clock Generation

The FS2331 DDR probe uses one logic analyzer machine to capture DDR commands (using the common clock CK0) and another machine to capture DDR burst data (using the source synchronous strobe DQS0). The logic analyzer automatically combines the trace data from both machines into a single time correlated trace of DDR bus activity.

The circuitry on the probe is used to generate the proper state analysis clocks for the command and data analysis machines.

DDR Commands

Since the DDR bus global clock is differential it is converted to a single ended clock for the analyzer using a differential line receiver. DDR Commands are sampled on the rising edge of this clock.

DDR Data

The FS2331 supports state analysis of DDR busses by combining a specially processed version of the DQS0 strobe with Agilent's Eye Finder technology. This allows the analyzer/probe combination to accurately locate (much as a DDR controller chipset does) the read and write data valid windows for each data bus signal and sample the data at the proper time for reliable state analysis.

Each DDR bus implementation will have different timing due to trace length variation on the motherboard, variations in bus loading for each DIMM configuration, and sensitivity to dynamic factors such as crosstalk or simultaneous switching noise. Therefore, the precise position of the DDR data eye will vary from system to system and even within a system as DIMM configurations or data access patterns change. To achieve the most reliable data capture the location of the data eye must be determined on a given system using worst case data access patterns. The logic analyzers Eye Finder feature is used to measure the location of the eye for each data signal over millions of burst cycles and so achieve the most reliable state capture. By using the proper stimulus when running Eye Finder the worst-case data valid window boundaries are found and the analyzer is set to sample data at the center of the actual data valid window of each signal for each specific DDR implementation and DIMM configuration.

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Contents Revision DDR Sdram Analysis Probe FS2331How to reach us Product Warranty Signal Connections For Sales and Marketing Support For Technical SupportProduct Warranty Limitation of warrantyExclusive Remedies Introduction Probe Cable, Connector NumberingDefinitions Logic Analyzer ModulesFS2331 100 pin Connector to Pod Diagram Probe Feature Summary FS2331 Probe DescriptionProbe Components Probe Design DDR CommandsState Clock Generation DDR DataPage Pod Clock Domain Clock Rate Probe Pod AssignmentSwitch # Default factory Function Position Probe Switch SettingsOn closed Logic Analyzer Signal Threshold Voltage Settings Connecting the Probe to the Logic AnalyzerConnecting Power to the FS2331 Probe Card Requirements for PC2700 Systems Logic Analyzer Card Requirements 16753/4/5/6Recommended Setting up the 169xx Analyzer Setting up the 167xx AnalyzerSoftware Requirements System Software 169xx LicensingTiming Analysis All DDR speeds and supported analyzer cards Card Configurations for State Analysis Probing multiple DDR busses Interleaved memory If User is dedicating a Connecting to your Target System Chip Select§ Isolate the Dedicated DIMM’s pin Chip Select Jumper locations§ Sleeve the Pin Unused Pods § Wire from the adjacent Dimm slot to the isolated pinOffline Analysis Filtering Timing Analysis Operation Loading the Inverse Assembler and Decoding DDR CommandsState Analysis Operation Taking a Trace, Triggering, and Seeing Measurement ResultsInverse Assembler and Decoding DDR Commands Tracing the Serial Presence Detect Signals Using Eye Finder with the FS2331 DDR Probe Using EyeScan with the FS2331 Probe Dimm Signal Loading Option Using the FS2331 DDR Probe with an Interposer FS1024/25FS2331 Calibration Page Set Command sample position Page Page Write Burst Data Valid Position Page Page Page Read Burst Data Valid Position Page Page Page Set the final analyzer sample position Adjust the delay line value to maximize R/W overlapPage Standards supported General InformationSamtec Signal Connections J1 DataSA0 CB4 J2 Data and CommandSpare J3 Command and Data Buffcmdclk DM5DQS14 J4 DataDQS7
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