Agilent Technologies FS2331 user manual

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Not all channels have a data valid window after the clock. This is because the clock for data bursts is active on both rising and falling edges of the strobe. When the Eye Finder measurement looks at the time period after the strobe, it sometimes is looking at the data line after the end of a burst (which will occur after the last falling edge of the strobe). The data will not always be stable at that time, so Eye Finder will sometimes see no data valid window after the strobe.

The data valid windows appear to be about 1.5ns in size for the Data signals. Actual measurement with a scope showed the windows were actually closer to 2.5ns. Eye Finder is really measuring how much larger the data valid window is than the actual window required by the analyzer at the time of the measurement. Eye sizes measured with a scope will typically be about 1ns larger than those indicated on the Eye Finder display. Even if a window shows up as only a few hundred picoseconds in width in the Eye Finder display, you should be able to capture state data since the actual data valid window will be 1.25ns or more. This reemphasizes that the Eye Finder results should not be treated as definitive, quantitative data. They can however help you rapidly sort through dozens of signals to find the few that deserve closer examination.

Eye Finder did not always choose to suggest a sample position that is on the same side of the clock for all channels. In general, Eye Finder will choose the data valid window that is closest to time 0 (the clock).

The DataClk is not stable around time 0. This is to be expected since time 0 is the point where DataClk rises or falls. The data valid windows around time 0 are about the same size, indicating a 50% duty cycle for the strobe.

The unstable regions of DataClk around +- 3 / 4 ns are fairly large. This may indicate actual clock jitter or jitter added by the probe when receiving DQS0. More detailed examination with a scope can help identify the sources of the jitter.

The positions of the data valid windows for the data lines are close but not identical. This is due to measurement uncertainty as well as actual skews due to DRAM, DIMM, DDR probe and motherboard layout. It can also be an artifact of the stimulus if effects such as inter-symbol interference or simultaneous switching effects are not uniformly distributed across all data lines. If there is too much skew, that would be an indication that closer examination with a scope may be warranted.

The strobe lines are offset from the data lines by one quarter cycle. This is correct behavior for write cycles. Note that the strobes precede the analyzer clock due to the propagation delay of the DQS0 processing circuitry that generates the analyzer clock. While the edges of the strobes are properly centered on the data valid windows for these write bursts, the analyzer clock is not centered. This is normal and acceptable since the analyzer sample position will be adjusted in step 5 to sample data at the proper time relative to DQS0.

The ECC bits of the DIMM were being used as indicated by the activity on the CB lines.

The Serial Presence Detect lines are stable. This is normal when making measurements after the DDR bus controller has completed its initialization of the bus.

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Contents Revision DDR Sdram Analysis Probe FS2331How to reach us Product Warranty Signal Connections For Sales and Marketing Support For Technical SupportProduct Warranty Limitation of warrantyExclusive Remedies Logic Analyzer Modules Probe Cable, Connector NumberingIntroduction DefinitionsFS2331 100 pin Connector to Pod Diagram Probe Feature Summary FS2331 Probe DescriptionProbe Components DDR Data DDR CommandsProbe Design State Clock GenerationPage Pod Clock Domain Clock Rate Probe Pod AssignmentSwitch # Default factory Function Position Probe Switch SettingsOn closed Logic Analyzer Signal Threshold Voltage Settings Connecting the Probe to the Logic AnalyzerConnecting Power to the FS2331 Probe Card Requirements for PC2700 Systems Logic Analyzer Card Requirements 16753/4/5/6Recommended 169xx Licensing Setting up the 167xx AnalyzerSetting up the 169xx Analyzer Software Requirements System SoftwareTiming Analysis All DDR speeds and supported analyzer cards Card Configurations for State Analysis Probing multiple DDR busses Interleaved memory If User is dedicating a Connecting to your Target System Chip Select§ Isolate the Dedicated DIMM’s pin Chip Select Jumper locations§ Sleeve the Pin Unused Pods § Wire from the adjacent Dimm slot to the isolated pinOffline Analysis Filtering Taking a Trace, Triggering, and Seeing Measurement Results Loading the Inverse Assembler and Decoding DDR CommandsTiming Analysis Operation State Analysis OperationInverse Assembler and Decoding DDR Commands Tracing the Serial Presence Detect Signals Using Eye Finder with the FS2331 DDR Probe Using EyeScan with the FS2331 Probe Dimm Signal Loading Option Using the FS2331 DDR Probe with an Interposer FS1024/25FS2331 Calibration Page Set Command sample position Page Page Write Burst Data Valid Position Page Page Page Read Burst Data Valid Position Page Page Page Set the final analyzer sample position Adjust the delay line value to maximize R/W overlapPage Standards supported General InformationSamtec Signal Connections J1 DataSA0 CB4 J2 Data and CommandSpare J3 Command and Data Buffcmdclk DM5DQS14 J4 DataDQS7