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Chapter 1. Introduction
TSU 600 TESTING
The TSU 600 offers three forms of testing:
•Self test
•Loopback tests (local and remote)
•Pattern generation and check
Self Tests
The self test checks the integrity of the internal operation of the electronic components by performing memory tests and by sending and verifying data test patterns through all internal interfaces. Although actual user data cannot be passed during these tests, the self test can be run with the network and DTE interfaces in place and will not disturb any external interface.
The memory portion of the self test automatically executes upon power up. A full self test can be com- manded from a front panel menu or from
In addition to the specified self tests, background tests are also run on various parts of the internal electron- ics. These run during normal operation to confirm continued correct functioning. The background tests include: (1) monitoring the phase locked loop for lock,
(2)sending test data through a parallel path which is looped back and verified, and (3) the standard back- ground network performance monitoring, as required by ANSI T1.403 and AT&T 54016 specifications for which the results are stored.
Loopback Tests
A number of different loopbacks can be invoked locally from the front panel, by
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