ADTRAN TSU 600 Test Pattern Results Display, Number of seconds with at least, Bit error

Models: TSU 600

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Chapter 3. Operation

 

*

 

Figure 3-21

 

Test Pattern Results Display

ES

The number of seconds with at least 1

 

bit error.

BES

The number of seconds with more

 

than 1 bit error and less than 320.

SES

The number of seconds with more

 

than 320 bit errors.

*SYNC

Indicates if pattern sync is, (yes) or is

 

not, (no) valid. The asterisk (*)

 

indicates if pattern sync has been lost

 

since the start of testing.

Results can be cleared by pressing Clear (shift 9).

The results are accumulated until the test pattern is set to None or Cleared.

The use of TST DS0s for testing can be very useful, particularly in Fractional T1 applications. An end to end test can be run on the Fractional DS0s by 1) setting for Map B the TST in the same DS0 as used by Map A to receive data from an Nx56/64 port and 2) by looping the far end using a V.54 loopback code on the Nx56/64 port. In addition, a single DS0 can be used for continuous testing while other DS0s are passing normal data. This will also provide an end to end check on the entire link. Set each end to send QRSS in TST DS0s (using 1 DS0) and occasionally view the results on the Pattern Result menu selection.

61200.076L2-1

TSU 600 User Manual

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Page 93
Image 93
ADTRAN TSU 600 Test Pattern Results Display, Number of seconds with at least, Bit error, Number of seconds with more