Skew DAC Adjustment Procedure (cont’d)

Example Program (cont’d)

440

!----------

Perform cal ----------

 

450

OUTPUT @Afg;"*RST;*CLS;*OPC?"

!Reset AFG

460ENTER @Afg;Result

470!

480!Set up Spec Analyzer

490Setup_spec(VAL$(Amp_in_dbm-2)&"DM",VAL$(Freq*Harmonic),Search_span$)

500!

510!Set up AFG

520OUTPUT @Afg;"FUNC SIN;";

530OUTPUT @Afg;":VOLT "&VAL$(Amp_in_dbm)&"DBM;";

540OUTPUT @Afg;":FREQ "&VAL$(Freq)

550OUTPUT @Afg;"INIT:IMM"

560

Load_delay_dac(Dac_word)

!Load constant into register

570

!

 

580!Capture and center 2nd harmonic

590Get_2nd_harm(Test_span$)

600!

610!Begin cal search loop

620Search_loop=1

630REPEAT

640ALLOCATE INTEGER Word_array(0:((Max_word-Min_word)/Step_size))

650ALLOCATE REAL Meas_array(0:((Max_word-Min_word)/Step_size))

660Array_counter=0

670!

680PRINT "LOOP =";Search_loop

690PRINT

700PRINT "CONSTANT"," READING"

710PRINT "--------"," -------"

720!

730!Find constant that produces minimum 2nd harmonic

740FOR I=Min_word TO Max_word STEP Step_size

750IF I=256 THEN

760Dac_word=255

770ELSE

780

Dac_word=I

 

790

END IF

 

800

Load_delay_dac(Dac_word)

!Load constant into register

810Word_array(Array_counter)=Dac_word

820!

830!Measure 2nd_harmonic, store in array

840Meas_2nd_harm(Meas_array(Array_counter))

850PRINT Word_array(Array_counter),DROUND(Meas_array(Array_counter),8)

860Array_counter=Array_counter+1

870NEXT I

880!

(Continued on next page)

112 Adjustments

Agilent E1445A Service Manual

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Agilent Technologies 75000 Series C, E1445A service manual Repeat, Print Print CONSTANT, Reading

75000 Series C, E1445A specifications

The Agilent Technologies E1445A is part of the renowned 75000 Series C modular test and measurement instruments, specifically designed to provide high-performance capabilities for advanced electronic testing applications. This versatile and compact device is essential for engineers and technicians who require reliable and accurate measurement solutions in research and development, manufacturing, and quality assurance environments.

One of the main features of the E1445A is its modular architecture, which allows for a high degree of customization and scalability. Users can integrate the E1445A with other modules within the 75000 Series C, facilitating a wide range of testing scenarios from basic measurements to complex multi-channel applications. This modularity not only maximizes resource utilization but also simplifies maintenance and upgrades, ensuring longevity and adaptability in rapidly evolving technological landscapes.

The E1445A is equipped with advanced measurement technologies that enhance its performance. It offers precision analog and digital measurement capabilities, which are essential for a diverse array of applications, including semiconductor testing, circuit debugging, and signal integrity analysis. With its highly accurate time and frequency measurements, the E1445A stands out in applications that demand meticulous timing and synchronization.

The device also features a high-speed data acquisition system, enabling users to capture and analyze signals at faster rates. This is complemented by sophisticated signal processing algorithms that improve noise immunity and measurement reliability, making it suitable even for challenging environments. Furthermore, the E1445A supports various communication interfaces, which facilitate seamless connectivity with modern computer systems and data analysis software.

Another characteristic of the E1445A is its user-friendly interface, which simplifies operation and minimizes the learning curve for new users. The intuitive controls and graphical display make it easier for users to navigate through various measurement setups and results. Additionally, the device comes with extensive documentation and support resources, allowing users to maximize their efficiency and effectiveness in test execution.

In summary, the Agilent Technologies E1445A from the 75000 Series C is a robust and flexible test and measurement solution. Its modularity, advanced measurement technologies, high-speed capabilities, and user-friendly interface make it a valuable tool for professionals in electronics testing and validation. Its ability to adapt to a wide range of applications positions it as a critical asset in today's fast-paced technological environment.