Skew DAC Adjustment Procedure (cont’d)

Example Program (cont’d)

890

!Set variables for next loop

 

900

MAT SEARCH Meas_array,LOC MIN;Loc_min

!Get location of min rdg

910

Cal_word=Word_array(Loc_min)

 

920

Min_word=Word_array(MAX(0,Loc_min-1))

 

930

Max_word=Word_array(MIN((SIZE(Word_array,1)-1),Loc_min+1))

940Step_size=Step_size/INT(SQRT(Start_step_size)+.5) !Reduce step size

950!

960PRINT

970PRINT

980!

990DEALLOCATE Meas_array(*),Word_array(*) 1000 Search_loop=Search_loop+1

1010 UNTIL Step_size<1

1020 !

1030 PRINT "CAL CONSTANT =";Cal_word

1040 PRINT

1050

Wrt_skew_con(Cal_word)

!Write word to eeprom

1060

!

 

1070

!---------- Quit ----------

 

1080

OUTPUT @Afg;"*RST;*CLS"

 

1090

ASSIGN @Afg TO *

 

1100

ASSIGN @Analyzer TO *

 

1110

STOP

 

1120

END

 

1130

!

 

1140 Load_delay_dac:SUB Load_delay_dac(INTEGER Delay_dac)

1150

COM @Afg,@Analyzer,Secure_code$

 

1160

INTEGER Lower_8,Benign_chn1

 

1170

!

 

1180

Benign_chn1=1

 

1190

Lower_8=BINAND(Delay_dac,255)

 

1200

!

 

1210

OUTPUT @Afg;"DIAG:POKE #HE0000B,8,2"

 

1220

OUTPUT @Afg;"DIAG:POKE #HE0000D,8,"&VAL$(Lower_8)

1230

OUTPUT @Afg;"DIAG:POKE #HE0000B,8,7"

 

1240

OUTPUT @Afg;"DIAG:POKE #HE0000D,8,"&VAL$(Benign_chn1+7)

1250

WAIT .1

 

1260

SUBEND

 

1270

!

 

(Continued on next page)

Agilent E1445A Service Manual

Adjustments 113

Page 115
Image 115
Agilent Technologies E1445A, 75000 Series C service manual Set variables for next loop

75000 Series C, E1445A specifications

The Agilent Technologies E1445A is part of the renowned 75000 Series C modular test and measurement instruments, specifically designed to provide high-performance capabilities for advanced electronic testing applications. This versatile and compact device is essential for engineers and technicians who require reliable and accurate measurement solutions in research and development, manufacturing, and quality assurance environments.

One of the main features of the E1445A is its modular architecture, which allows for a high degree of customization and scalability. Users can integrate the E1445A with other modules within the 75000 Series C, facilitating a wide range of testing scenarios from basic measurements to complex multi-channel applications. This modularity not only maximizes resource utilization but also simplifies maintenance and upgrades, ensuring longevity and adaptability in rapidly evolving technological landscapes.

The E1445A is equipped with advanced measurement technologies that enhance its performance. It offers precision analog and digital measurement capabilities, which are essential for a diverse array of applications, including semiconductor testing, circuit debugging, and signal integrity analysis. With its highly accurate time and frequency measurements, the E1445A stands out in applications that demand meticulous timing and synchronization.

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Another characteristic of the E1445A is its user-friendly interface, which simplifies operation and minimizes the learning curve for new users. The intuitive controls and graphical display make it easier for users to navigate through various measurement setups and results. Additionally, the device comes with extensive documentation and support resources, allowing users to maximize their efficiency and effectiveness in test execution.

In summary, the Agilent Technologies E1445A from the 75000 Series C is a robust and flexible test and measurement solution. Its modularity, advanced measurement technologies, high-speed capabilities, and user-friendly interface make it a valuable tool for professionals in electronics testing and validation. Its ability to adapt to a wide range of applications positions it as a critical asset in today's fast-paced technological environment.