AC Flatness Adjustment Procedure (cont’d)

Example Program

10! RE-STORE "AC_FLAT"

30!This program performs the AC flatness adjustment procedure for

40!the E1445A Arbitrary Function Generator. An 3458A DMM

50!and an Agilent 8902A Measuring Receiver are required.

60!

70!To perform the flatness measurements without adjustments, change

80!Mode$ to "M" below.

90!

100COM @Afg,@Dmm,@Pwr_mtr,@Analyzer,Secure_code$[12]

110COM /Flat/ INTEGER Num_points,Max_con

120CLEAR SCREEN

130!

140!---------- Set up I/O paths ----------

150ASSIGN @Afg TO 70910

160ASSIGN @Dmm TO 722

170ASSIGN @Pwr_mtr TO 714

180

Mode$="M"

!’M’ means measure, ’A’ means adjust

190

Secure_code$="E1445A"

!Calibration security code

200

!

 

210CALL Flatness("250KHZ",Mode$)

220CALL Flatness("10MHZ",Mode$)

230!

240!---------- QUIT ----------

250!RESET INSTRUMENTS

260OUTPUT @Afg;"*RST;*CLS"

270OUTPUT @Pwr_mtr;"IP"

280OUTPUT @Dmm;"RESET"

290LOCAL @Dmm

300LOCAL @Pwr_mtr

310!

320!CLOSE I/O PATHS

330ASSIGN @Afg TO *

340ASSIGN @Dmm TO *

350ASSIGN @Pwr_mtr TO *

360STOP

370!

380END

390!

400!******************** End Of Main Program ********************

410!

(Continued on next page)

96 Adjustments

Agilent E1445A Service Manual

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Agilent Technologies 75000 Series C AC Flatness Adjustment Procedure cont’d, 10! RE-STORE Acflat, 250 !RESET Instruments

75000 Series C, E1445A specifications

The Agilent Technologies E1445A is part of the renowned 75000 Series C modular test and measurement instruments, specifically designed to provide high-performance capabilities for advanced electronic testing applications. This versatile and compact device is essential for engineers and technicians who require reliable and accurate measurement solutions in research and development, manufacturing, and quality assurance environments.

One of the main features of the E1445A is its modular architecture, which allows for a high degree of customization and scalability. Users can integrate the E1445A with other modules within the 75000 Series C, facilitating a wide range of testing scenarios from basic measurements to complex multi-channel applications. This modularity not only maximizes resource utilization but also simplifies maintenance and upgrades, ensuring longevity and adaptability in rapidly evolving technological landscapes.

The E1445A is equipped with advanced measurement technologies that enhance its performance. It offers precision analog and digital measurement capabilities, which are essential for a diverse array of applications, including semiconductor testing, circuit debugging, and signal integrity analysis. With its highly accurate time and frequency measurements, the E1445A stands out in applications that demand meticulous timing and synchronization.

The device also features a high-speed data acquisition system, enabling users to capture and analyze signals at faster rates. This is complemented by sophisticated signal processing algorithms that improve noise immunity and measurement reliability, making it suitable even for challenging environments. Furthermore, the E1445A supports various communication interfaces, which facilitate seamless connectivity with modern computer systems and data analysis software.

Another characteristic of the E1445A is its user-friendly interface, which simplifies operation and minimizes the learning curve for new users. The intuitive controls and graphical display make it easier for users to navigate through various measurement setups and results. Additionally, the device comes with extensive documentation and support resources, allowing users to maximize their efficiency and effectiveness in test execution.

In summary, the Agilent Technologies E1445A from the 75000 Series C is a robust and flexible test and measurement solution. Its modularity, advanced measurement technologies, high-speed capabilities, and user-friendly interface make it a valuable tool for professionals in electronics testing and validation. Its ability to adapt to a wide range of applications positions it as a critical asset in today's fast-paced technological environment.