Test 2-1: DC Zeros (cont’d)

Example Program (cont’d)

440 PRINT

460FOR Filter=0 TO 2

470SELECT Filter

480

CASE 0

!No filter

490OUTPUT @Afg;"OUTP:FILT OFF"

500Filter$="NONE"

510

CASE 1

!250KHZ filter

520OUTPUT @Afg;"OUTP:FILT:FREQ 250KHZ"

530OUTPUT @Afg;"OUTP:FILT ON"

540Filter$="250 kHz"

550

CASE 2

!10MHZ filter

560OUTPUT @Afg;"OUTP:FILT:FREQ 10MHZ"

570OUTPUT @Afg;"OUTP:FILT ON"

580Filter$="10 MHz"

590END SELECT

600!

610

FOR I=1 TO 9

!Loop through atten’s

620

OUTPUT @Afg;":VOLT "&VAL$(Vout(I))

!Set AFG amplitude

630PRINT Attn(I),Filter$,Vout(I)

640!

650DISP "Record DMM reading, then press ’Continue’"

660PAUSE

670DISP

680

NEXT I

!Next attenuation

690

PRINT

 

700

NEXT Filter

!Next filter

710

!

 

720

OUTPUT @Afg;"*RST;*CLS"

!Reset AFG

730END

740!

750SUB Def_seq_zeros

760COM @Afg

770

OUTPUT @Afg;"LIST:SEGM:SEL ZEROS"

!Segment name

780

OUTPUT @Afg;"LIST:SEGM:DEF 8"

!Segment length

790OUTPUT @Afg;"LIST:SEGM:VOLT 0,0,0,0,0,0,0,0" !Voltage points

800!

810

OUTPUT @Afg;"LIST:SSEQ:SEL DC_ZEROS"

!Sequence name

820

OUTPUT @Afg;"LIST:SSEQ:DEF 1"

!# of segments

830

OUTPUT @Afg;"LIST:SSEQ:SEQ ZEROS"

!Segment list

840

SUBEND

 

Agilent E1445A Service Manual

Verification Tests 37

Page 39
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Agilent Technologies E1445A, 75000 Series C service manual Case, END Select, Next

75000 Series C, E1445A specifications

The Agilent Technologies E1445A is part of the renowned 75000 Series C modular test and measurement instruments, specifically designed to provide high-performance capabilities for advanced electronic testing applications. This versatile and compact device is essential for engineers and technicians who require reliable and accurate measurement solutions in research and development, manufacturing, and quality assurance environments.

One of the main features of the E1445A is its modular architecture, which allows for a high degree of customization and scalability. Users can integrate the E1445A with other modules within the 75000 Series C, facilitating a wide range of testing scenarios from basic measurements to complex multi-channel applications. This modularity not only maximizes resource utilization but also simplifies maintenance and upgrades, ensuring longevity and adaptability in rapidly evolving technological landscapes.

The E1445A is equipped with advanced measurement technologies that enhance its performance. It offers precision analog and digital measurement capabilities, which are essential for a diverse array of applications, including semiconductor testing, circuit debugging, and signal integrity analysis. With its highly accurate time and frequency measurements, the E1445A stands out in applications that demand meticulous timing and synchronization.

The device also features a high-speed data acquisition system, enabling users to capture and analyze signals at faster rates. This is complemented by sophisticated signal processing algorithms that improve noise immunity and measurement reliability, making it suitable even for challenging environments. Furthermore, the E1445A supports various communication interfaces, which facilitate seamless connectivity with modern computer systems and data analysis software.

Another characteristic of the E1445A is its user-friendly interface, which simplifies operation and minimizes the learning curve for new users. The intuitive controls and graphical display make it easier for users to navigate through various measurement setups and results. Additionally, the device comes with extensive documentation and support resources, allowing users to maximize their efficiency and effectiveness in test execution.

In summary, the Agilent Technologies E1445A from the 75000 Series C is a robust and flexible test and measurement solution. Its modularity, advanced measurement technologies, high-speed capabilities, and user-friendly interface make it a valuable tool for professionals in electronics testing and validation. Its ability to adapt to a wide range of applications positions it as a critical asset in today's fast-paced technological environment.