Skew DAC Adjustment Procedure (cont’d)

Example Program

10 ! RE-STORE "SKEW_CAL"

20 COM @Afg,@Analyzer,Secure_code$[20]

30 INTEGER Dac_bits,Dac_word,Min_word,Max_word,Step_size,Harmonic

40INTEGER Loc_min,Cal_word,Search_loop,Max_search_loop,Filter,Skew_con

50DIM Id$[50]

60!

70!---------- Assign I/O paths ----------

80ASSIGN @Afg TO 70910

90ASSIGN @Analyzer TO 718

100!

110!---------- Check firmware rev ----------

120!Rev A.01.00 does not support this cal procedure

130OUTPUT @Afg;"*IDN?"

140ENTER @Afg;Id$

150!

160IF POS(Id$,"A.01.00") THEN

170PRINT "This rev does not support skew DAC calibration."

180STOP

190END IF

200!

210!---------- Initialize variables ----------

220

Secure_code$="E1445A"

!AFG security code

230

Harmonic=2

!Harmonic to be minimized

240

Filter=0

!No filter

250

Freq=4.E+6

!AFG frequency (Hz)

260

Amp_in_dbm=11

!AFG amplitude (dBm)

270

Search_span$=VAL$(Freq*Harmonic*4.00E-4)

!Initial Spec Analyzer span

280

Test_span$="2000"

!Span used for measurements

290

!

 

300

Dac_bits=8

 

310

Start_step_size=16

 

320Step_size=Start_step_size

330Max_search_loop=4

340

Dac_word=2^(Dac_bits-1)

!Initial Dac_word

350

Max_word=2^(Dac_bits)

!Initial max

360

Min_word=0

!Initial min

370

!

 

 

380

!----------

Test connections ----------

 

390PRINT "Connect Spectrum Analyzer to AFG Ouput."

400DISP "Press ’Continue’ when ready"

410PAUSE

420CLEAR SCREEN

430!

(Continued on next page)

Agilent E1445A Service Manual

Adjustments 111

Page 113
Image 113
Agilent Technologies E1445A, 75000 Series C service manual 10 ! RE-STORE Skewcal, Pause Clear Screen

75000 Series C, E1445A specifications

The Agilent Technologies E1445A is part of the renowned 75000 Series C modular test and measurement instruments, specifically designed to provide high-performance capabilities for advanced electronic testing applications. This versatile and compact device is essential for engineers and technicians who require reliable and accurate measurement solutions in research and development, manufacturing, and quality assurance environments.

One of the main features of the E1445A is its modular architecture, which allows for a high degree of customization and scalability. Users can integrate the E1445A with other modules within the 75000 Series C, facilitating a wide range of testing scenarios from basic measurements to complex multi-channel applications. This modularity not only maximizes resource utilization but also simplifies maintenance and upgrades, ensuring longevity and adaptability in rapidly evolving technological landscapes.

The E1445A is equipped with advanced measurement technologies that enhance its performance. It offers precision analog and digital measurement capabilities, which are essential for a diverse array of applications, including semiconductor testing, circuit debugging, and signal integrity analysis. With its highly accurate time and frequency measurements, the E1445A stands out in applications that demand meticulous timing and synchronization.

The device also features a high-speed data acquisition system, enabling users to capture and analyze signals at faster rates. This is complemented by sophisticated signal processing algorithms that improve noise immunity and measurement reliability, making it suitable even for challenging environments. Furthermore, the E1445A supports various communication interfaces, which facilitate seamless connectivity with modern computer systems and data analysis software.

Another characteristic of the E1445A is its user-friendly interface, which simplifies operation and minimizes the learning curve for new users. The intuitive controls and graphical display make it easier for users to navigate through various measurement setups and results. Additionally, the device comes with extensive documentation and support resources, allowing users to maximize their efficiency and effectiveness in test execution.

In summary, the Agilent Technologies E1445A from the 75000 Series C is a robust and flexible test and measurement solution. Its modularity, advanced measurement technologies, high-speed capabilities, and user-friendly interface make it a valuable tool for professionals in electronics testing and validation. Its ability to adapt to a wide range of applications positions it as a critical asset in today's fast-paced technological environment.