Command Coupling Many of the AFG SCPI commands are value-coupled. In order to prevent "Settings Conflict" errors, coupled commands must be sent contiguously by placing them in the same program line, or by suppressing the end-of-line terminator. (For more information on command coupling and syntax, see Chapter 1 of the Agilent E1445A User’s Manual). In HP BASIC, the end-of-line terminator can be suppressed by linking the commands with a semi-colon (;) and a colon (:), as illustrated below:

ROSC:SOUR INT1; :TRIG:SOUR INT1

In the Example programs, these commands would appear as follows:

OUTPUT 70910;"ROSC:SOUR:INT1;";

OUTPUT 70910;":TRIG:SOUR:INT1"

Functional Verification

The purpose of these tests is to verify that the AFG is functioning properly and that all front panel inputs and outputs are working. No attempt is made to verify that the AFG is meeting specifications. Functional Verification for the AFG includes the following tests:

Self-Test

Ref In/Marker Out Test

Start Arm In Test

Gate In Test

Output Relay Test

NOTE

NOTE

For a quick functional check of the AFG, perform only the Self-Test.

An example program that performs all of the Functional Verification tests is included at the end of this section. An Agilent E1405/E1406 Command Module is required for this program.

Some of the tests use the "TRIG OUT" port of the Command Module. This port uses negative logic, i.e., the high voltage is a logical 0 and the low voltage is a logical 1.

18 Verification Tests

Agilent E1445A Service Manual

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Agilent Technologies 75000 Series C Functional Verification, Example programs, these commands would appear as follows

75000 Series C, E1445A specifications

The Agilent Technologies E1445A is part of the renowned 75000 Series C modular test and measurement instruments, specifically designed to provide high-performance capabilities for advanced electronic testing applications. This versatile and compact device is essential for engineers and technicians who require reliable and accurate measurement solutions in research and development, manufacturing, and quality assurance environments.

One of the main features of the E1445A is its modular architecture, which allows for a high degree of customization and scalability. Users can integrate the E1445A with other modules within the 75000 Series C, facilitating a wide range of testing scenarios from basic measurements to complex multi-channel applications. This modularity not only maximizes resource utilization but also simplifies maintenance and upgrades, ensuring longevity and adaptability in rapidly evolving technological landscapes.

The E1445A is equipped with advanced measurement technologies that enhance its performance. It offers precision analog and digital measurement capabilities, which are essential for a diverse array of applications, including semiconductor testing, circuit debugging, and signal integrity analysis. With its highly accurate time and frequency measurements, the E1445A stands out in applications that demand meticulous timing and synchronization.

The device also features a high-speed data acquisition system, enabling users to capture and analyze signals at faster rates. This is complemented by sophisticated signal processing algorithms that improve noise immunity and measurement reliability, making it suitable even for challenging environments. Furthermore, the E1445A supports various communication interfaces, which facilitate seamless connectivity with modern computer systems and data analysis software.

Another characteristic of the E1445A is its user-friendly interface, which simplifies operation and minimizes the learning curve for new users. The intuitive controls and graphical display make it easier for users to navigate through various measurement setups and results. Additionally, the device comes with extensive documentation and support resources, allowing users to maximize their efficiency and effectiveness in test execution.

In summary, the Agilent Technologies E1445A from the 75000 Series C is a robust and flexible test and measurement solution. Its modularity, advanced measurement technologies, high-speed capabilities, and user-friendly interface make it a valuable tool for professionals in electronics testing and validation. Its ability to adapt to a wide range of applications positions it as a critical asset in today's fast-paced technological environment.