Skew DAC Adjustment Procedure (cont’d)

Example Program (cont’d)

1690 Meas_2nd_harm:SUB Meas_2nd_harm(Reading)

 

1700

COM @Afg,@Analyzer,Secure_code$

 

1710

OUTPUT @Analyzer;"TS;E1"

!Find peak

1720

OUTPUT @Analyzer;"MA"

!Measure amplitude

1730

ENTER @Analyzer;Reading

 

1740

SUBEND

 

1750

!

 

1760 Read_skew_con:SUB Read_skew_con(INTEGER Skew_cal_con)

1770

COM @Afg,@Analyzer,Secure_code$

 

1780

ALLOCATE Id$[50]

 

1790

!

 

1800

OUTPUT @Afg;"*IDN?"

 

1810

ENTER @Afg;Id$

 

1820

IF POS(Id$,"A.01.00") THEN

 

1830

Skew_cal_con=128

 

1840

SUBEXIT

 

1850

END IF

 

1860

!

 

1870

STATUS @Afg,3;Address

 

1880

!

 

1890

OUTPUT @Afg;"CAL:SEC:STAT OFF,"&Secure_code$

1900

OUTPUT @Afg;"CAL:DATA:SKEW?"

 

1910

ASSIGN @Afg TO Address;FORMAT OFF

 

1920

ENTER @Afg USING "3A,1(W)";Dummy$[1,3],Skew_cal_con

1930

ASSIGN @Afg TO Address

 

1940

OUTPUT @Afg;"CAL:SEC:STAT ON"

 

1950

SUBEND

 

Agilent E1445A Service Manual

Adjustments 115

Page 117
Image 117
Agilent Technologies E1445A, 75000 Series C service manual Meas2ndharmSUB Meas2ndharmReading

75000 Series C, E1445A specifications

The Agilent Technologies E1445A is part of the renowned 75000 Series C modular test and measurement instruments, specifically designed to provide high-performance capabilities for advanced electronic testing applications. This versatile and compact device is essential for engineers and technicians who require reliable and accurate measurement solutions in research and development, manufacturing, and quality assurance environments.

One of the main features of the E1445A is its modular architecture, which allows for a high degree of customization and scalability. Users can integrate the E1445A with other modules within the 75000 Series C, facilitating a wide range of testing scenarios from basic measurements to complex multi-channel applications. This modularity not only maximizes resource utilization but also simplifies maintenance and upgrades, ensuring longevity and adaptability in rapidly evolving technological landscapes.

The E1445A is equipped with advanced measurement technologies that enhance its performance. It offers precision analog and digital measurement capabilities, which are essential for a diverse array of applications, including semiconductor testing, circuit debugging, and signal integrity analysis. With its highly accurate time and frequency measurements, the E1445A stands out in applications that demand meticulous timing and synchronization.

The device also features a high-speed data acquisition system, enabling users to capture and analyze signals at faster rates. This is complemented by sophisticated signal processing algorithms that improve noise immunity and measurement reliability, making it suitable even for challenging environments. Furthermore, the E1445A supports various communication interfaces, which facilitate seamless connectivity with modern computer systems and data analysis software.

Another characteristic of the E1445A is its user-friendly interface, which simplifies operation and minimizes the learning curve for new users. The intuitive controls and graphical display make it easier for users to navigate through various measurement setups and results. Additionally, the device comes with extensive documentation and support resources, allowing users to maximize their efficiency and effectiveness in test execution.

In summary, the Agilent Technologies E1445A from the 75000 Series C is a robust and flexible test and measurement solution. Its modularity, advanced measurement technologies, high-speed capabilities, and user-friendly interface make it a valuable tool for professionals in electronics testing and validation. Its ability to adapt to a wide range of applications positions it as a critical asset in today's fast-paced technological environment.