Performance Test Record

Table 2-11,Performance Test Record for the Agilent E1445A AFG, is a form you can copy and use to record performance verification test results for the AFG. Table 2-11 shows AFG accuracy, measurement uncertainty, and test accuracy ratio (TAR) values.

AFG Test Limits Test limits are defined using the specifications in Appendix A of the Agilent E1445A User’s Manual. The specifications for Total Harmonic Distortion and Spurious/Non-harmonic Distortion are single-sided (i.e., there is an upper limit but no lower limit). In the Performance Test Record, the Minimum column will be blank.

Measurement For the performance verification tests in this manual, the measurement

Uncertainty uncertainties are based on the accuracy specifications for the following test equipment:

 

Performance Test

Test Equipment

 

 

 

1.

DC Zeros

Agilent 3458A

 

 

 

2.

DC Accuracy

Agilent 3458A

 

 

 

3.

DC Offset

Agilent 3458A

 

 

 

4.

AC Accuracy

Agilent 3458A

 

 

 

5.

AC Flatness (250 kHz filter)

Agilent 3458A

 

 

 

6.

AC Flatness (10 MHz filter)*

Agilent 3458A

 

 

Agilent 8902A

 

 

 

7.

Frequency Accuracy

Agilent 5334B

 

 

 

8.

Duty Cycle

Agilent 5334B

 

 

 

9.

Total Harmonic Distortion

Agilent 8566B

 

 

10. Spurious/Non-harmonic Distortion

Agilent 8566B

 

 

 

 

 

 

*Includes following uncertainties: 8902A Range linearity, 11722A Power Sensor Cal Factor uncertainty, 3458A accuracy at 100 kHz.

Agilent E1445A Service Manual

Verification Tests 73

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Agilent Technologies E1445A, 75000 Series C service manual Performance Test Record, Performance Test Test Equipment

75000 Series C, E1445A specifications

The Agilent Technologies E1445A is part of the renowned 75000 Series C modular test and measurement instruments, specifically designed to provide high-performance capabilities for advanced electronic testing applications. This versatile and compact device is essential for engineers and technicians who require reliable and accurate measurement solutions in research and development, manufacturing, and quality assurance environments.

One of the main features of the E1445A is its modular architecture, which allows for a high degree of customization and scalability. Users can integrate the E1445A with other modules within the 75000 Series C, facilitating a wide range of testing scenarios from basic measurements to complex multi-channel applications. This modularity not only maximizes resource utilization but also simplifies maintenance and upgrades, ensuring longevity and adaptability in rapidly evolving technological landscapes.

The E1445A is equipped with advanced measurement technologies that enhance its performance. It offers precision analog and digital measurement capabilities, which are essential for a diverse array of applications, including semiconductor testing, circuit debugging, and signal integrity analysis. With its highly accurate time and frequency measurements, the E1445A stands out in applications that demand meticulous timing and synchronization.

The device also features a high-speed data acquisition system, enabling users to capture and analyze signals at faster rates. This is complemented by sophisticated signal processing algorithms that improve noise immunity and measurement reliability, making it suitable even for challenging environments. Furthermore, the E1445A supports various communication interfaces, which facilitate seamless connectivity with modern computer systems and data analysis software.

Another characteristic of the E1445A is its user-friendly interface, which simplifies operation and minimizes the learning curve for new users. The intuitive controls and graphical display make it easier for users to navigate through various measurement setups and results. Additionally, the device comes with extensive documentation and support resources, allowing users to maximize their efficiency and effectiveness in test execution.

In summary, the Agilent Technologies E1445A from the 75000 Series C is a robust and flexible test and measurement solution. Its modularity, advanced measurement technologies, high-speed capabilities, and user-friendly interface make it a valuable tool for professionals in electronics testing and validation. Its ability to adapt to a wide range of applications positions it as a critical asset in today's fast-paced technological environment.