AC Flatness Adjustment Procedure (cont’d)

Example Program (cont’d)

420 Flatness:SUB Flatness(Filter$,Mode$)

430COM @Afg,@Dmm,@Pwr_mtr,@Analyzer,Secure_code$

440COM /Flat/ INTEGER Num_points,Max_con

450INTEGER Filter,Ac_cal_int(1:2)

460CLEAR SCREEN

470!

480!---------- Initialize variables ----------

490

Ampl_dbm=24

!AFG max amplitude

500

!

 

510!---------- Main Program ----------

520IF Filter$="250KHZ" THEN

530

Num_points=25

!Number of test points

540

Max_freq=2.50E+5

 

550

ELSE

!Else, 10M filter will be used

560

Num_points=27

!Number of test points

570

Max_freq=1.08E+7

 

580

END IF

 

590PRINT "FILTER = "&Filter$

600!

610ALLOCATE Test_freq(1:Num_points),Results(1:Num_points)

620!

630!Determine test frequencies

640Step_size=Max_freq/Num_points

650FOR I=1 TO Num_points

660Test_freq(I)=Step_size*I

670NEXT I

680!

690GOSUB Setup_afg

700CALL Meas_flat(Test_freq(*),Results(*),Filter$)

710!

720IF Mode$="A" THEN

730CALL Adj_flat(Results(*),Filter$,Test_freq(Num_points))

740END IF

750!

760DEALLOCATE Test_freq(*),Results(*)

770SUBEXIT

780!

790Setup_afg: !

800OUTPUT @Afg;"*RST;*CLS"

810WAIT .5

820!

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Agilent E1445A Service Manual

Adjustments 97

Page 99
Image 99
Agilent Technologies E1445A, 75000 Series C service manual 470 480 !---------- Initialize variables

75000 Series C, E1445A specifications

The Agilent Technologies E1445A is part of the renowned 75000 Series C modular test and measurement instruments, specifically designed to provide high-performance capabilities for advanced electronic testing applications. This versatile and compact device is essential for engineers and technicians who require reliable and accurate measurement solutions in research and development, manufacturing, and quality assurance environments.

One of the main features of the E1445A is its modular architecture, which allows for a high degree of customization and scalability. Users can integrate the E1445A with other modules within the 75000 Series C, facilitating a wide range of testing scenarios from basic measurements to complex multi-channel applications. This modularity not only maximizes resource utilization but also simplifies maintenance and upgrades, ensuring longevity and adaptability in rapidly evolving technological landscapes.

The E1445A is equipped with advanced measurement technologies that enhance its performance. It offers precision analog and digital measurement capabilities, which are essential for a diverse array of applications, including semiconductor testing, circuit debugging, and signal integrity analysis. With its highly accurate time and frequency measurements, the E1445A stands out in applications that demand meticulous timing and synchronization.

The device also features a high-speed data acquisition system, enabling users to capture and analyze signals at faster rates. This is complemented by sophisticated signal processing algorithms that improve noise immunity and measurement reliability, making it suitable even for challenging environments. Furthermore, the E1445A supports various communication interfaces, which facilitate seamless connectivity with modern computer systems and data analysis software.

Another characteristic of the E1445A is its user-friendly interface, which simplifies operation and minimizes the learning curve for new users. The intuitive controls and graphical display make it easier for users to navigate through various measurement setups and results. Additionally, the device comes with extensive documentation and support resources, allowing users to maximize their efficiency and effectiveness in test execution.

In summary, the Agilent Technologies E1445A from the 75000 Series C is a robust and flexible test and measurement solution. Its modularity, advanced measurement technologies, high-speed capabilities, and user-friendly interface make it a valuable tool for professionals in electronics testing and validation. Its ability to adapt to a wide range of applications positions it as a critical asset in today's fast-paced technological environment.