Test 2-3: DC Offset

Description

The purpose of this test is to verify that the AFG meets its specifications for

DC offset accuracy.

Equipment Setup

•Connect equipment as shown in Figure 2-5

•Set DMM to DCV, autorange

Test Procedure

1.Reset the AFG:

*RST;*CLS

Reset AFG and clear

 

status registers

2.Delete all sequences and segments from memory:

LIST:SSEQ:DEL:ALL

Delete all sequences

LIST:SEGM:DEL:ALL

Delete all segments

3.Create a user-defined waveform made up of zeros:

LIST:SEGM:SEL ZEROS

Select segment name

LIST:SEGM:DEF 8

# of segment points

LIST:SEGM:VOLT 0,0,0,0,0,0,0,0

Segment list

LIST:SSEQ:SEL DC_ZEROS

Select sequence name

LIST:SSEQ:DEF 1

# of segments

LIST:SSEQ:SEQ ZEROS

Sequence list

4.Set up the AFG to output the waveform defined above:

ROSC:SOUR CLK10;

Select 10 MHz clock

:OUTP:LOAD INF;

Infinite load

:VOLT MAX;

Set amplitude

:FUNC USER

Select user waveform

FUNC:USER DC_ZEROS

Select sequence

INIT:IMM

Initiate waveform

Agilent E1445A Service Manual

Verification Tests 41

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Agilent Technologies E1445A, 75000 Series C service manual Test 2-3 DC Offset, Reset the AFG
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75000 Series C, E1445A specifications

The Agilent Technologies E1445A is part of the renowned 75000 Series C modular test and measurement instruments, specifically designed to provide high-performance capabilities for advanced electronic testing applications. This versatile and compact device is essential for engineers and technicians who require reliable and accurate measurement solutions in research and development, manufacturing, and quality assurance environments.

One of the main features of the E1445A is its modular architecture, which allows for a high degree of customization and scalability. Users can integrate the E1445A with other modules within the 75000 Series C, facilitating a wide range of testing scenarios from basic measurements to complex multi-channel applications. This modularity not only maximizes resource utilization but also simplifies maintenance and upgrades, ensuring longevity and adaptability in rapidly evolving technological landscapes.

The E1445A is equipped with advanced measurement technologies that enhance its performance. It offers precision analog and digital measurement capabilities, which are essential for a diverse array of applications, including semiconductor testing, circuit debugging, and signal integrity analysis. With its highly accurate time and frequency measurements, the E1445A stands out in applications that demand meticulous timing and synchronization.

The device also features a high-speed data acquisition system, enabling users to capture and analyze signals at faster rates. This is complemented by sophisticated signal processing algorithms that improve noise immunity and measurement reliability, making it suitable even for challenging environments. Furthermore, the E1445A supports various communication interfaces, which facilitate seamless connectivity with modern computer systems and data analysis software.

Another characteristic of the E1445A is its user-friendly interface, which simplifies operation and minimizes the learning curve for new users. The intuitive controls and graphical display make it easier for users to navigate through various measurement setups and results. Additionally, the device comes with extensive documentation and support resources, allowing users to maximize their efficiency and effectiveness in test execution.

In summary, the Agilent Technologies E1445A from the 75000 Series C is a robust and flexible test and measurement solution. Its modularity, advanced measurement technologies, high-speed capabilities, and user-friendly interface make it a valuable tool for professionals in electronics testing and validation. Its ability to adapt to a wide range of applications positions it as a critical asset in today's fast-paced technological environment.
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