Test 2-3: DC Offset (cont’d)

Example Program

This program performs the DC Offset Test.

10! RE-STORE "DC_OFFSET"

20COM @Afg

30DIM Offset(1:6)

40!

50!---------- Set up I/O path and reset AFG ----------

60

ASSIGN @Afg TO 70910

!AFG I/O path

70

OUTPUT @Afg;"*RST;*CLS"

!Reset AFG

80

!

 

90!---------- Initialize variables ----------

100DATA 9.755,4.0,-4.0,-9.755,2.0,-2.0

110

READ Offset(*)

!Read in offsets

120

!

 

130

Vout_old=0

!Initialize

140

!

 

150!---------- Set up DMM ----------

160CLEAR SCREEN

170PRINT "Set up DMM:"

180PRINT

190PRINT " Function -- DCV"

200PRINT " Range -- AUTO"

210PRINT

220PRINT "Connect DMM HI and LO to AFG Output."

230DISP "Press ’Continue’ when ready"

240PAUSE

250CLEAR SCREEN

260!

270!---------- Set up AFG ----------

280

OUTPUT @Afg;"*RST"

!Reset AFG

290

OUTPUT @Afg;"LIST:SSEQ:DEL:ALL"

!Delete all sequences

300

OUTPUT @Afg;"LIST:SEGM:DEL:ALL"

!Delete all segments

310

WAIT .5

 

320

OUTPUT @Afg;"ROSC:SOUR CLK10;";

!10MHz clock

330

OUTPUT @Afg;":OUTP:LOAD INF;";

!Infinite load

340

OUTPUT @Afg;":VOLT MAX;";

!MAX output

350

OUTPUT @Afg;":FUNC USER"

!User waveform

360

!

 

370

CALL Def_seq_zeros

!Define sequence of zeros

380

OUTPUT @Afg;"FUNC:USER DC_ZEROS"

!Select sequence

390

!

 

400!---------- Perform test ----------

410PRINT "AMPLITUDE"," OFFSET"

420PRINT

430!

(Continued on next page)

Agilent E1445A Service Manual

Verification Tests 43

Page 45
Image 45
Agilent Technologies E1445A This program performs the DC Offset Test, 10! RE-STORE Dcoffset, Print AMPLITUDE, Offset

75000 Series C, E1445A specifications

The Agilent Technologies E1445A is part of the renowned 75000 Series C modular test and measurement instruments, specifically designed to provide high-performance capabilities for advanced electronic testing applications. This versatile and compact device is essential for engineers and technicians who require reliable and accurate measurement solutions in research and development, manufacturing, and quality assurance environments.

One of the main features of the E1445A is its modular architecture, which allows for a high degree of customization and scalability. Users can integrate the E1445A with other modules within the 75000 Series C, facilitating a wide range of testing scenarios from basic measurements to complex multi-channel applications. This modularity not only maximizes resource utilization but also simplifies maintenance and upgrades, ensuring longevity and adaptability in rapidly evolving technological landscapes.

The E1445A is equipped with advanced measurement technologies that enhance its performance. It offers precision analog and digital measurement capabilities, which are essential for a diverse array of applications, including semiconductor testing, circuit debugging, and signal integrity analysis. With its highly accurate time and frequency measurements, the E1445A stands out in applications that demand meticulous timing and synchronization.

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In summary, the Agilent Technologies E1445A from the 75000 Series C is a robust and flexible test and measurement solution. Its modularity, advanced measurement technologies, high-speed capabilities, and user-friendly interface make it a valuable tool for professionals in electronics testing and validation. Its ability to adapt to a wide range of applications positions it as a critical asset in today's fast-paced technological environment.