C(continued)
Current (continued)
ac (continued) range/resolution, resolution, 121 specifications, 174– 176
true RMS measurements, 32– 35
dc
aperture time, 122 integration time, 122– 123 measurement errors, 32
124– 125
range/resolution, 88, 103 resolution, 126
resolution vs. integration time, 70 specifications, 171– 173
leakage errors, 26 maximum, 15 measurement, connections, 22
D
Data Points, 97 DATA Subsystem, 97
DATA:POINts?, 97 dB Measurements, 42– 43 dBm Measurements, 43 DC Current
aperture time, 122 integration time, 122– 123 measurement errors, 32 measurement range, 124– 125 measurement range/resolution, measurement resolution, 126 resolution vs. integration time, specifications, 171– 173
DC Voltage aperture time, 147 blocking circuitry, 36
common mode rejection (CMR), 27 ground loops noise, 28
high speed measurements, 31 input impedance, 100
input resistance, 37 integration time, 147 leakage current errors, 26 loading errors, 26 magnetic loops noise, 28 measurements, 25– 28
common mode rejection (CMR), 27 ground loops noise, 28
high speed, 31
DC Voltage (continued) measurements (continued)
leakage current errors, 26 loading errors (dc volts), 26 magnetic loops noise, 28 range, 149– 150 range/resolution, 94, 109 ratio range/resolution, 95, 110 rejecting power line noise voltages, 27 resolution, 151
thermal EMF errors, 25 rejecting power line noise voltages, 27 resolution vs. integration time, 70 specifications, 171– 173
Declaration of Conformity, 11– 12 Delays
settling time, 31 trigger
defaults, 50, 159 querying, 51, 158– 159 setting, 49– 50, 157– 159
Description of Modules, 15 Dielectric Absorption, 31 Digits, number of, 15, 38, 182 Disabling
automatic input impedance, 100 autorange
dc voltage measurements, 150 frequency measurements, 130 period measurements, 138 resistance measurements, 142
83, 152, 197
math function, 78 Discrete Parameters, 69 Documentation History, 10 DUT Power Dissipation, 31 Dynamic Addressing, 16
