Device User Guide — 9S12C128DGV1/D V01.05

A.1.6 ESD Protection and Latch-up Immunity

All ESD testing is in conformity with CDF-AEC-Q100 Stress test qualification for Automotive Grade Integrated Circuits. During the device qualification ESD stresses were performed for the Human Body Model (HBM), the Machine Model (MM) and the Charge Device Model.

A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device specification. Complete DC parametric and functional testing is performed per the applicable device specification at room temperature followed by hot temperature, unless specified otherwise in the device specification.

Table A-2 ESD and Latch-up Test Conditions

Model

Description

Symbol

Value

Unit

 

 

 

 

 

 

Series Resistance

R1

1500

Ohm

 

 

 

 

 

 

Storage Capacitance

C

100

pF

Human Body

 

 

 

 

Number of Pulse per pin

 

-

 

 

 

 

 

positive

-

3

 

 

negative

 

3

 

 

 

 

 

 

 

Series Resistance

R1

0

Ohm

 

 

 

 

 

 

Storage Capacitance

C

200

pF

Machine

 

 

 

 

Number of Pulse per pin

 

-

 

 

 

 

 

positive

-

3

 

 

negative

 

3

 

 

 

 

 

 

Latch-up

Minimum input voltage limit

 

-2.5

V

 

 

 

 

Maximum input voltage limit

 

7.5

V

 

 

 

 

 

 

 

Table A-3 ESD and Latch-Up Protection Characteristics

Num

C

Rating

Symbol

Min

Max

Unit

 

 

 

 

 

 

 

1

C

Human Body Model (HBM)

VHBM

2000

-

V

2

C

Machine Model (MM)

VMM

200

-

V

3

C

Charge Device Model (CDM)

VCDM

500

-

V

 

 

Latch-up Current at 125°C

ILAT

 

 

 

4

C

positive

+100

-

mA

 

 

negative

 

-100

 

 

 

 

 

 

 

 

 

 

 

Latch-up Current at 27°C

ILAT

 

 

 

5

C

positive

+200

-

mA

 

 

negative

 

-200

 

 

 

 

 

 

 

 

 

A.1.7 Operating Conditions

This chapter describes the operating conditions of the devices. Unless otherwise noted those conditions apply to all the following data.

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Motorola MC9S12GC-Family ESD Protection and Latch-up Immunity, Operating Conditions, Model Description Symbol Value Unit