Motorola MC9S12C-Family, MC9S12GC-Family warranty Table B-9 NVM Reliability Characteristics

Models: MC9S12C-Family MC9S12GC-Family

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Device User Guide — 9S12C128DGV1/D V01.05

B.5.2 NVM Reliability

The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process monitors and burn-in to screen early life failures.

The failure rates for data retention and program/erase cycling are specified at <2ppm defects over lifetime at the operating conditions noted.

A program/erase cycle is specified as two transitions of the cell value from erased programmed erased, 1 0 1.

NOTE: All values shown in Table B-9 are target values and subject to further extensive characterization.

Table B-9 NVM Reliability Characteristics

Conditions are shown in Table A-4 unless otherwise noted

Num

C

Rating

Symbol

Min

Typ

Max

Unit

 

 

 

 

 

 

 

 

1

C

Data Retention at an average junction temperature of

tNVMRET

15

 

 

Years

TJavg = 85°C

 

 

 

 

 

 

 

 

 

2

C

Flash number of Program/Erase cycles

nFLPE

10,000

 

 

Cycles

107

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Motorola MC9S12C-Family, MC9S12GC-Family warranty Table B-9 NVM Reliability Characteristics