1
3
5
7
9
11
13
2
4
6
8
10
12
14
TDO/TDI
TDI/VPP
TMS
TCK
GND
TEST/VPP
JTAG
VCCTOOL
VCCTARGET
J1 (see Note A)
J2(see Note A)
VCC
R1
47 k
(see Note B)
W
C2
10 µF
C3
0.1 µF
V /AV /DVCCCC CC
RST/NMI
TDO/TDI
TDI/VPP
TMS
TCK
TEST/VPP (see Note C)
V /AV /DV
SS SS SS
MSP430Fxxx
C1
10 nF/2.2 nF
(see Notes B and E)
RST(see Note D)
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Signal Connections for In-System Programming and Debugging

A Makeeither connection J1 in case a local target power supply is used or connection J2 to power target from the
debug/programmingadapter.
B TheRST/NMI pin R1/C1 configuration is device family dependent. See the respective MSP430 family user's guide for
therecommended configuration.
C TheTEST pin is available only on MSP430 family members with multiplexed JTAG pins. See the device-specific data
sheetto determine if this pin is available.
D Theconnection to the JTAG connector RST pin is optional when using 4-wire JTAG communication mode
capable-onlydevices and not required for device programming or debugging. However, this connection is required
whenusing 2-wire JTAG communication mode capable devices in 4-wire JTAG mode.
E Whenusing 2-wire JTAG communication capable devices in 4-wire JTAG mode, the upper limit for C1 should not
exceed2.2 nF. This applies to both TI FET interface modules (LPT/USB FET).
Figure 2-1. Signal Connections for 4-Wire JTAG Communication
25
SLAU278F–May 2009 –Revised December 2010 DesignConsiderations for In-Circuit Programming
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