Samsung KFKAGH6Q4M, KFM4GH6Q4M, KFN8GH6Q4M Revision History

Flex-MuxOneNAND4G(KFM4GH6Q4M-DEBx)
- 2 -
FLASH MEMORY
Flex-MuxOneNAND8G(KFN8GH6Q4M-DEBx)
Flex-MuxOneNAND16G(KFKAGH6Q4M-DEBx)
Revision History
Document Title
Flex-MuxOneNAND
Revision History
Revision No.
0.0
0.1
History
1. Initial issue.
1. Corrected errata.
2. Chapter 1.3 Product Features revised.
3. Chapter 2.8.16 Start Address8 Register F107 revised.
4. Chapter 2.8.18 Command Register F220h revised.
5. Chapter 2.8.19 System Configuration 1 Register F221h corrected errata.
6. Chapter 2.8.21 Controller Status Register F240h revised.
7. Chapter 2.8.22 Interrupt Status Register F241h revised.
8. Chapter 3.1.2 Load Data Into Buffer Command.
9. Chapter 3.3 Reset Mode Operation revised.
10. Chapter 3.3.1 Cold Reset Mode Operation revised.
11. Chapter 3.4.3 NAND Array Write Protection States corrected errata.
12. Chapter 3.4.3.1 Unlocked NAND Array Write Protection State.
13. Chapter 3.4.4 Data Protection Operation Flow Diagram revised.
14. Chapter 3.4.4 All Block Unlock Flow Diagram revised.
15. Chapter 3.6 Load Operation Flow Chart Diagram revised.
16. Chapter 3.6.1 Superload Operation revised.
17. Chapter 3.6.2 LSB Page Recovery Read updated.
18. Chapter 3.8 Synchronous Write revised.
19. Chapter 3.9 Program Operation Flow Diagram revised.
Program Interleave Flow Chart updated.
20. Chapter 3.9.1 Cache Program Operation Flow diagram revised.
21. Chapter 3.9.2 Interleave Cache Program Operation revised.
22. Chapter 3.10 Copy-Back Program Operation with Random Data Input
Flow Chart revised.
23. Chapter 3.11.1 Block Erase Operation Flow Chart revised.
Erase Interleave Flow Chart updated.
24. Chapter 3.12 Partition Information Block corrected errata.
25. Chapter 3.12.1 PI Block Load Operation revised.
26. Chapter 3.12.2 PI Block Boundary Information setting updated.
27. OTP Operation revised.
28. Chapter 3.13.2 OTP Block Program Operation revised.
29. Chapter 3.13.3 OTP Block Lock Operation and Flow Chart revised.
30. Chapter 3.13.4 1st Block OTP Lock Operation revised.
31. Chapter 3.13.5 OTP and 1st Block OTP Lock Operation revised.
32. Chapter 3.16 Invalid Block Operation revised.
33. Chapter 4.1 Absolute Maximum Ratings revised.
34. Chapter 4.2 Operating Conditions revised.
35. Chapter 4.3 DC Characteristics revised.
36. Chapter 5.1 AC Test Conditions revised.
37. Chapter 5.3 Valid Block Characteristics revised.
38. Chapter 5.4 AC Characteristics for Synchronous Burst Read revised.
39. Chapter 5.8 AC Characteristics for Burst Write Operation revised.
40. Chapter 5.9 AC Characteristics for Load/Program/Erase Performance
revised.
41. Chapter 6.15 Cold Reset Timing revised.
42. Chapter 7.3 Partition of Flex-MuxOneNAND corrected errata.
Draft Date
Nov. 28, 2006
Aug. 13, 2007
Remark
Advanced
Preliminary