TMS320F2809, TMS320F2808, TMS320F2806

TMS320F2802, TMS320F2801, TMS320C2802

TMS320C2801, TMS320F28016, TMS320F28015

SPRS230L –OCTOBER 2003 –REVISED DECEMBER 2009

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8 Revision History

This data sheet revision history highlights the technical changes made to the SPRS230K device-specific data sheet to make it an SPRS230L revision.

Scope: Changed MIN Nf value [Flash endurance for the array (write/erase cycles)] from 100 cycles to

 

20000 cycles. See Table 6-43and Table 6-44.

 

Changed TYP Nf value [Flash endurance for the array (write/erase cycles)] from 1000 cycles to

 

50000 cycles. See Table 6-43and Table 6-44.

 

See table below.

 

 

 

 

 

 

 

LOCATION

 

 

 

ADDITIONS, DELETIONS, AND MODIFICATIONS

 

 

 

Table 2-3

 

Signal Descriptions:

 

 

 

Changed "In a low-noise environment,

 

may be left floating. In other instances, an external

 

 

TRST:

TRST

 

 

 

pulldown resistor is highly recommended" to "An external pulldown resistor is required on this pin"

 

 

 

 

 

 

 

Figure 4-4

 

ePWM Sub-Modules Showing Critical Internal Signal Interconnections:

 

 

• Changed TBCTL[CNTLDE] to TBCTL[PHSEN]

 

 

• Resized "HiRes PWM (HRPWM)" dashed box

 

 

 

 

 

 

 

Table 4-5

 

ADC Registers:

 

 

0x711E–0x711F: Changed DESCRIPTION from "ADC Status Register" to "Reserved"

 

 

 

 

 

 

 

Section 5.2

 

Documentation Support:

 

 

• Updated Software list

 

 

 

 

 

 

 

Table 6-37

 

SPI Slave Mode External Timing (Clock Phase = 1):

 

 

• Parameter 18 (Valid time, SPISOMI data valid after SPICLK low): Changed "(clock polarity = 0)" to "(clock

 

 

 

polarity = 1)"

 

 

• Parameter 18 (Valid time, SPISOMI data valid after SPICLK high): Changed "(clock polarity = 1)" to "(clock

 

 

 

polarity = 0)"

 

 

 

 

 

 

 

Table 6-43

 

Flash Endurance for A and S Temperature Material:

 

 

• Nf [Flash endurance for the array (write/erase cycles)]:

 

 

 

– Changed MIN value from 100 cycles to 20000 cycles

 

 

 

– Changed TYP value from 1000 cycles to 50000 cycles

 

 

 

 

 

 

 

Table 6-44

 

Flash Endurance for Q Temperature Material:

 

 

• Nf [Flash endurance for the array (write/erase cycles)]:

 

 

 

– Changed MIN value from 100 cycles to 20000 cycles

 

 

 

– Changed TYP value from 1000 cycles to 50000 cycles

 

 

 

 

 

 

 

134

Revision History

Copyright © 2003–2009, Texas Instruments Incorporated

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