TMS320F2809, TMS320F2808, TMS320F2806

TMS320F2802, TMS320F2801, TMS320C2802

TMS320C2801, TMS320F28016, TMS320F28015

www.ti.com

SPRS230L –OCTOBER 2003 –REVISED DECEMBER 2009

2.2Signal Descriptions

Table 2-3describes the signals on the 280x devices. All digital inputs are TTL-compatible. All outputs are 3.3 V with CMOS levels. Inputs are not 5-V tolerant.

 

 

 

 

 

Table 2-3. Signal Descriptions

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

PIN NO.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

NAME

PZ

GGM/

 

 

 

DESCRIPTION

(1)

 

 

 

ZGM

 

 

 

 

 

 

 

 

 

PIN #

 

 

 

 

 

 

 

 

 

 

 

BALL #

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

JTAG

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

JTAG test reset with internal pulldown.

TRST,

when driven high, gives the scan system control of

 

 

 

 

 

the operations of the device. If this signal is not connected or driven low, the device operates in its

 

 

 

 

 

functional mode, and the test reset signals are ignored.

 

 

 

 

 

 

 

 

NOTE: Do not use pullup resistors on TRST; it has an internal pull-down device.

TRST

is an active

 

TRST

 

84

A6

high test pin and must be maintained low at all times during normal device operation. An external

 

 

 

 

 

pulldown resistor is required on this pin. The value of this resistor should be based on drive strength

 

 

 

 

 

of the debugger pods applicable to the design. A 2.2-kΩ resistor generally offers adequate

 

 

 

 

 

protection. Since this is application-specific, it is recommended that each target board be validated

 

 

 

 

 

for proper operation of the debugger and the application. (I, ↓)

 

TCK

75

A10

JTAG test clock with internal pullup (I, ↑)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

TMS

74

B10

JTAG test-mode select (TMS) with internal pullup. This serial control input is clocked into the TAP

 

controller on the rising edge of TCK. (I, ↑)

 

 

 

 

 

 

 

 

 

 

 

 

TDI

73

C9

JTAG test data input (TDI) with internal pullup. TDI is clocked into the selected register (instruction

 

or data) on a rising edge of TCK. (I, ↑)

 

 

 

 

 

 

 

 

 

 

 

 

TDO

76

B9

JTAG scan out, test data output (TDO). The contents of the selected register (instruction or data)

 

are shifted out of TDO on the falling edge of TCK. (O/Z 8 mA drive)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Emulator pin 0. When

 

is driven high, this pin is used as an interrupt to or from the emulator

 

 

 

 

 

TRST

 

 

 

 

 

system and is defined as input/output through the JTAG scan. This pin is also used to put the

 

 

 

 

 

device into boundary-scan mode. With the EMU0 pin at a logic-high state and the EMU1 pin at a

 

 

 

 

 

logic-low state, a rising edge on the TRST pin would latch the device into boundary-scan mode.

 

EMU0

80

A8

(I/O/Z, 8 mA drive ↑)

 

 

 

 

 

 

 

 

NOTE: An external pullup resistor is recommended on this pin. The value of this resistor should be

 

 

 

 

 

based on the drive strength of the debugger pods applicable to the design. A 2.2-kΩ to 4.7-kΩ

 

 

 

 

 

resistor is generally adequate. Since this is application-specific, it is recommended that each target

 

 

 

 

 

board be validated for proper operation of the debugger and the application.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Emulator pin 1. When

 

is driven high, this pin is used as an interrupt to or from the emulator

 

 

 

 

 

TRST

 

 

 

 

 

system and is defined as input/output through the JTAG scan. This pin is also used to put the

 

 

 

 

 

device into boundary-scan mode. With the EMU0 pin at a logic-high state and the EMU1 pin at a

 

 

 

 

 

logic-low state, a rising edge on the TRST pin would latch the device into boundary-scan mode.

 

EMU1

81

B7

(I/O/Z, 8 mA drive ↑)

 

 

 

 

 

 

 

 

NOTE: An external pullup resistor is recommended on this pin. The value of this resistor should be

 

 

 

 

 

based on the drive strength of the debugger pods applicable to the design. A 2.2-kΩ to 4.7-kΩ

 

 

 

 

 

resistor is generally adequate. Since this is application-specific, it is recommended that each target

 

 

 

 

 

board be validated for proper operation of the debugger and the application.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

FLASH

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

VDD3VFL

96

C4

3.3-V Flash Core Power Pin. This pin should be connected to 3.3 V at all times. On the ROM

 

parts (C280x), this pin should be connected to VDDIO.

 

 

 

 

 

 

 

 

 

 

 

 

TEST1

97

A3

Test Pin. Reserved for TI. Must be left unconnected. (I/O)

 

 

 

 

 

 

 

 

 

 

 

 

 

TEST2

98

B3

Test Pin. Reserved for TI. Must be left unconnected. (I/O)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

CLOCK

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Output clock derived from SYSCLKOUT. XCLKOUT is either the same frequency, one-half the

 

 

 

 

 

frequency, or one-fourth the frequency of SYSCLKOUT. This is controlled by the bits 1, 0

 

XCLKOUT

66

E8

(XCLKOUTDIV) in the XCLK register. At reset, XCLKOUT = SYSCLKOUT/4. The XCLKOUT signal

 

 

 

 

 

can be turned off by setting XCLKOUTDIV to 3. Unlike other GPIO pins, the XCLKOUT pin is not

 

 

 

 

 

placed in high-impedance state during a reset. (O/Z, 8 mA drive).

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

External Oscillator Input. This pin is used to feed a clock from an external 3.3-V oscillator. In this

 

XCLKIN

90

B5

case, tie the X1 pin to GND. Alternately, when a crystal/resonator is used (or if an external 1.8-V

 

 

 

 

 

oscillator is fed into the X1 pin), tie the XCLKIN pin to GND. (I)

 

 

 

 

 

 

 

 

 

 

 

 

 

(1)I = Input, O = Output, Z = High impedance, OD = Open drain, ↑ = Pullup, ↓ = Pulldown

Copyright © 2003–2009, Texas Instruments Incorporated

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Texas Instruments TMS320F2808, TMS320F2809, TMS320C2802, TMS320C2801, TMS320F28016, TMS320F2806 Signal Descriptions