
Performance Tests
2-38 TDS5000B Series Specifications and PerformanceVerification
HFrom the toolbar,click the Horiz button. In the Horizontal menu,
open the Acquisition taband set the instrument to E.T. mode.
HClick the Close button.
2. Check channelisolation against limits:
a. Display the test signal: Set the generatorfrequency to 100 MHz and
adjust the output levelfor an 8-division display.
b. Check — Amplitude of each trace other than CH 1 is 0.0 8 division or
less (discount tracewidth). Enter the amplitude in the test record.
c. Move the signal to the CH 2 input connector, and then changethe
TriggerSOURCE to CH 2.
d. Check — Amplitude of each trace other than CH 2 is 0.0 8 division or
less (discount tracewidth). Enter the amplitude in the test record.
e. Move the signal to the CH 3 input connector, and then changethe
TriggerSOURCE to CH3(TDS5034B, TDS5054B, TDS5054BE, or
TDS5104B). If you arechecking a TDS5032B or TDS5052B, proceed to
step i below.
f. Check — Amplitude of each trace other than CH 3 is 0.0 8 division or
less (discount tracewidth). Enter the amplitude in the test record.
g. Move the signal to the CH 4 input connector, and then changethe
TriggerSOURCE to CH 4. (TDS5034B , TDS5054B, TDS5054BE, or
TDS5104B)
h. Check — Amplitude of each trace other than CH 4 is 0.0 8 division or
less (discount tracewidth). Enter the amplitude in the test record.
i. Move the signal to the CH 1 input connector, and then changethe
TriggerSOURCE to CH 1.
j. Set the generatoroutput frequency to 350 MHz for the TDS5032B and
TDS5034B, 500 MHz for the for the TDS5052B, TDS5054B, and
TDS5054BE, or 1 GHz for the TDS5104B. Adjust the generator output
level foran 8-division display.
k. Check — Amplitude of each trace other than CH 1 is 0.1 6 division or
less (discount tracewidth). Enter the amplitude in the test record.
l. Move the signal to the CH 2 input connector, and then changethe
TriggerSOURCE to CH 2.
m. Check — Amplitude of each trace other than CH 2 is 0.1 6 division or
less (discount tracewidth). Enter the amplitude in the test record.