Intel 5400 Series manual Recommended Test Sequence, Post-Test Pass Criteria

Models: 5400 Series

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Quality and Reliability Requirements

Table E-1.

Use Conditions Environment

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Use Environment

 

Speculative Stress

Example Use

Example 7-Yr

Example 10-

 

 

Yr Stress

 

 

Condition

 

 

Condition

Stress Equiv.

 

 

 

 

 

Equiv.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Shipping and

Mechanical Shock

 

Total of 12

n/a

n/a

 

Handling

System-level

 

drops per

 

 

 

 

Unpackaged

 

system:

 

 

 

 

 

2 drops per

 

 

 

 

Trapezoidal

 

 

 

 

 

 

 

 

 

axis

 

 

 

 

25 g

 

 

 

 

 

 

 

 

 

± direction

 

 

 

 

• velocity change is based

 

 

 

 

 

 

 

 

 

 

 

on packaged weight

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Product

 

Non-

 

 

 

 

 

 

 

Weight (lbs)

 

palletized

 

 

 

 

 

 

 

 

 

Product

 

 

 

 

 

 

 

 

 

Velocity

 

 

 

 

 

 

 

 

 

Change(in/

 

 

 

 

 

 

 

 

 

sec)

 

 

 

 

 

 

 

< 20 lbs

 

 

250

 

 

 

 

 

 

20 to > 40

 

 

225

 

 

 

 

 

 

40 to > 80

 

 

205

 

 

 

 

 

 

80 to < 100

 

 

175

 

 

 

 

 

 

100 to <

 

 

145

 

 

 

 

 

 

120

 

 

 

125

 

 

 

 

 

 

120

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Change in velocity is based

 

 

 

 

 

 

upon a 0.5 coefficient of

 

 

 

 

 

 

restitution.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Shipping and

Random Vibration

 

Total per

n/a

n/a

 

Handling

System Level

 

system:

 

 

 

 

Unpackaged

 

10 minutes

 

 

 

 

• 5 Hz to 500 Hz

 

 

per axis

 

 

 

 

 

3 axes

 

 

 

 

• 2.20 g RMS random

 

 

 

 

 

 

 

 

 

 

• 5 Hz @ .001 g2/Hz to

 

 

 

 

 

 

 

20 Hz @ 0.01 g2/Hz

 

 

 

 

 

 

 

(slope up)

 

 

 

 

 

 

 

 

• 20 Hz to 500 Hz @ 0.01

 

 

 

 

 

 

 

g2/Hz (flat)

 

 

 

 

 

 

 

 

Random control limit

 

 

 

 

 

 

 

tolerance is ± 3 dB

 

 

 

 

 

 

 

 

 

 

 

 

Note: In the case of a discrepancy, information in the most recent LGA771 Socket Mechanical Design

 

Guidelines supersedes that in the Table E-1above.

 

 

 

E.1.2.2

Recommended Test Sequence

 

 

 

 

Each test sequence should start with components (i.e. baseboard, heatsink assembly, etc.) that have not been previously submitted to any reliability testing.

The test sequence should always start with a visual inspection after assembly, and BIOS/Processor/memory test. The stress test should be then followed by a visual inspection and then BIOS/Processor/memory test.

E.1.2.3 Post-Test Pass Criteria

The post-test pass criteria are:

1.No significant physical damage to the heatsink and retention hardware.

2.Heatsink remains seated and its bottom remains mated flatly against the IHS surface. No visible gap between the heatsink base and processor IHS. No visible tilt of the heatsink with respect to the retention hardware.

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Quad-Core Intel® Xeon® Processor 5400 Series TMDG

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Intel 5400 Series manual Recommended Test Sequence, Post-Test Pass Criteria, Table E-1 Use Conditions Environment