Contents
1 | Introduction | .............................................................................................................. | 9 | |
| 1.1 | Objective | 9 | |
| 1.2 | Scope | 9 | |
| 1.3 | References | 9 | |
| 1.4 | Definition of Terms | 10 | |
2 | Thermal/Mechanical Reference Design | 13 | ||
| 2.1 | Mechanical Requirements | 13 | |
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| 2.1.1 | Processor Mechanical Parameters | 13 |
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| 2.1.2 | 14 | |
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| 2.1.3 | 18 | |
| 2.2 Processor Thermal Parameters and Features | 19 | ||
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| 2.2.1 | Thermal Control Circuit and TDP | 19 |
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| 2.2.2 | Digital Thermal Sensor | 20 |
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| 2.2.3 | Platform Environmental Control Interface (PECI) | 21 |
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| 2.2.4 | Multiple Core Special Considerations | 21 |
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| 2.2.5 | Thermal Profile | 24 |
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| 2.2.6 | TCONTROL Definition | 25 |
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| 2.2.7 | Thermal Profile Concepts for the |
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| Processor 5400 Series | 26 |
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| 2.2.8 | Performance Targets | 28 |
| 2.3 | Fan Fail Guidelines | 32 | |
| 2.4 Characterizing Cooling Solution Performance Requirements | 33 | ||
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| 2.4.1 | Fan Speed Control | 33 |
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| 2.4.2 | Processor Thermal Characterization Parameter Relationships | 34 |
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| 2.4.3 | Chassis Thermal Design Considerations | 36 |
| 2.5 Thermal/Mechanical Reference Design Considerations | 37 | ||
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| 2.5.1 | Heatsink Solutions | 37 |
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| 2.5.2 | Thermal Interface Material | 38 |
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| 2.5.3 | Summary | 38 |
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| 2.5.4 | Assembly Overview of the Intel Reference Thermal Mechanical Design | 39 |
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| 2.5.5 | Thermal Solution Performance Characteristics | 41 |
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| 2.5.6 | Thermal Profile Adherence | 42 |
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| 2.5.7 | Components Overview | 45 |
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| 2.5.8 | Boxed Active Thermal Solution for the |
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| Xeon® Processor 5400 Series Thermal Profile | 49 |
A | 1U Alternative Heatsink Thermal/Mechanical Design | 53 | ||
| A.1 | Component Overview | 53 | |
| A.2 Thermal Solution Performance Characterics | 54 | ||
| A.3 | Thermal Profile Adherence | 54 | |
B | Mechanical Drawings | 57 | ||
C | Heatsink Clip Load Methodology | 83 | ||
| C.1 | Overview | 83 | |
| C.2 | Test Preparation | 83 | |
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| C.2.1 | Heatsink Preparation | 83 |
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| C.2.2 | Typical Test Equipment | 86 |
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| C.2.3 | Test Procedure Examples | 86 |
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| C.2.4 | 86 | |
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| C.2.5 | Preload Degradation under Bake Conditions | 87 |
3 |