Quality and Reliability Requirements

EQuality and Reliability Requirements

E.1 Intel Verification Criteria for the Reference Designs

E.1.1 Reference Heatsink Thermal Verification

The Intel reference heatsinks will be verified within specific boundary conditions using a TTV and the methodology described in the Intel® Xeon® Dual- and Multi- Processor Family Thermal Test Vehicle User's Guide.

The test results, for a number of samples, are reported in terms of a worst-case mean

+3σ value for thermal characterization parameter using real processors (based on the TTV correction offset).

E.1.2 Environmental Reliability Testing

E.1.2.1 Structural Reliability Testing

The Intel reference heatsinks will be tested in an assembled condition, along with the LGA771 Socket. Details of the Environmental Requirements, and associated stress tests, can be found in the LGA771 Socket Mechanical Design Guide.

The use condition environment definitions provided in Appendix E-1are based on speculative use condition assumptions, and are provided as examples only.

Quad-Core Intel® Xeon® Processor 5400 Series TMDG

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Intel 5400 Series manual Intel Verification Criteria for the Reference Designs, Reference Heatsink Thermal Verification