Intel manual Testability Port Signals, GD82559ER - Networkin g Silicon, Datasheet

Models: GD82559ER

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GD82559ER — Networkin g Silicon

Symbol

Type

 

Name and Function

 

 

 

 

 

 

 

 

Flash Address[13]/EEPROM Data Input. During Flash accesses,

FLA[13]/

OUT

this multiplexed pin acts as the Flash Address [13] output signal.

EEDI

During EEPROM accesses, it acts as serial output data to the

 

 

 

EEPROM Data Input signal.

 

 

 

FLA[12:8]

OUT

Flash Address[12:8]. These pins are used as Flash address outputs

to support 128 Kbyte Flash addressing.

 

 

 

 

 

 

 

Flash Address[7]/Clock Enable. This is a multiplexed pin and acts

 

 

as the Flash Address[7] output signal during nominal operation. When

FLA[7]/

T/S

the PCI RST# signal is active, this pin acts as input control over the

CLKENB

FLA[16]/CLK25 output signal. If the FLA[7]/CLKEN pin is connected to

 

 

 

a pull-up resistor (3.3 KΩ), a 25 MHz clock signal is provided on the

 

 

FLA[16]/CLK25 output; otherwise, it is used as FLA[16] output.

 

 

 

FLA[6:2]

OUT

Flash Address[6:2]. These pins are used as Flash address outputs

to support 128

Kbyte Flash addressing.

 

 

 

 

 

 

 

Flash Address[1]/Auxiliary Power. This multiplexed pin acts as the

 

 

Flash Address[1] output signal during nominal operation. When RST is

FLA[1]/

T/S

active (low), it acts as the power supply indicator. If the 82559ER is fed

AUXPWR

PCI power, this pin should be connected to a pull-down resistor; if the

 

 

 

82559ER is fed by auxiliary power, this pin should be connected to a

 

 

pull-up resistor.

 

 

 

FLA[0]

T/S

Flash Address [0]. This pin acts as the Flash Address[0] output

signal during nominal operation.

 

 

 

 

 

EECS

OUT

EEPROM Chip Select. The EEPROM Chip Select signal is used to

assert chip select to the serial EEPROM.

 

 

 

 

 

FLCS#

OUT

Flash Chip Select. The Flash Chip Select signal is active during

Flash.

 

 

 

 

 

 

 

FLOE#

OUT

Flash Output Enable. This pin provides an active low output enable

control (read) to the Flash memory.

 

 

 

 

 

FLWE#

OUT

Flash Write Enable. This pin provides an active low write enable

control to the Flash memory.

 

 

 

 

 

 

3.4Testability Port Signals

Symbol

Type

Name and Function

 

 

 

 

 

 

TEST

IN

Test. If this input pin is high, the 82559ER will enable the test port.

During nominal operation this pin should be connected to a pull-down

 

 

resistor.

 

 

 

TCK

IN

Testability Port Clock. This pin is used for the Testability Port Clock

signal.

 

 

 

 

 

TI

IN

Testability Port Data Input. This pin is used for the Testability Port

Data Input signal.

 

 

 

 

 

TEXEC

IN

Testability Port Execute Enable. This pin is used for the Testability

Port Execute Enable signal.

 

 

 

 

 

TO

OUT

Testability Port Data Output. This pin is used for the Testability Port

Data Output signal.

 

 

 

 

 

10

Datasheet

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Intel manual Testability Port Signals, GD82559ER - Networkin g Silicon, Datasheet