GD82559ER — Networking Silicon
Figure 27, Figure 28, and Table 24 define the conditions under which timing measurements are done. The component test guarantees that all timings are met with minimum clock slew rate (slowest edge) and voltage swing. The design must guarantee that minimum timings are also met with maximum clock slew rate (fastest edge) and voltage swing. In addition, the design must guarantee proper input operation for input voltage swings and slew rates that exceed the specified test conditions.
O U T P U T D E L A Y
O U T P U T
V_th
V_test
V_tl
T_val
V_step
V_test V_test
T_on
T_off
C L K
V_th
I N P U T | V_test |
V_tl
V_test
T_su
T_h
inputs
valid
V_th
V_tl
V_test V_max
Symbol | PCI Level | Units | Notes |
|
|
|
|
Vth | 0.6VCC | V |
|
Vtl | 0.2VCC | V |
|
Vtest | 0.4VCC | V |
|
78 | Datasheet |