7.5 Drive Self-Test (DST)

7.5.3 Matters that are common to both modes

During a self-test, the INIT can obtain the progress of the self-test by referencing the "sense key specific information" field (bytes 16-17), which is returned in response to the REQUEST SENSE command. When the self-test has encountered no error, the HDD terminates the command with CHECK CONDITION status

(NOT READY [=2]/LOGICAL UNIT NOT READY, SELF-TEST IN PROGRESS [04-09]).

If the current test segment encounters an unrecoverable error during a self-test, the HDD updates the self-test result log page and terminates the self-test in progress. (If a recoverable error is detected during a self-test, the self-test result log page is not updated and the self-test in progress continues.)

The INIT can reference the self-test result log page to obtain information on the previous 20 self-tests that have been completed.

7.5.4 Short self-test

A short self-test is divided into several test segments, each of which is conducted as a simple test.

7.5.5 Extended self-test

An extended self-test is conducted for all test segments that are defined on the HDD. Each segment test is always initiated, beginning with sub-segment number 1.

The test execution time is reported using bytes 10-11 on the control mode page (PageCode = 0A) described in Section 5.1.7.

7.5.6 Test segments

The test items included in each test segment are explained below.

a.Buffer RAM test

This test segment performs write/read/compare checking of the data buffer area.

Increment, decrement, and single patterns are used as the data patterns. The single pattern is a data pattern consisting of "00h." For each sub-segment, these three types of patterns are used.

If a compare error is detected during the data compare check phase, Hardware Error [=4]/Buffer RAM Compare Error/Bus Error [40-81] (Reason code = '00h' for the single pattern, '01h' for the increment pattern, or '02h' for the decrement pattern) is reported on the self-test result log page.

C141-C013

407

Page 411
Image 411
Fujitsu MBC2073RC, MBC2036RC Matters that are common to both modes, Short self-test, Extended self-test, Test segments