Disk Media Management

7.5 Drive Self-Test (DST)

7.5.1 Overview

This function supports two types of self-tests based on the specification in the "SELF-TEST CODE" field of the SEND DIAGNOSTICS command as follows:

Short self-test

Extended self-test

A short self-test is conducted to quickly verify whether the HDD contains a defect, whereas an extended self-test is a more comprehensive test conducted by the HDD without INIT intervention.

A short self-test consists of one or more segments, and is completed within two minutes. An extended self-test consists of one or more segments, and the testing time is not limited.

The test segments that comprise self-tests are as shown below. These segments will be conducted in ascending order of the numbers assigned to them.

a.Buffer RAM test

b.Flash ROM test

c.Pre-SMART test

d.Low Level Format test

e.Data compare test

f.Random read test

g.Sequential read test

h.SMART test

What is performed during a given test segment is the same regardless of whether the test is a short self-test or extended self-test. The time required to complete an extended self-test is reported in the "Extended Self-Test Completion Time" field on the control mode page (Mode Page x0A).

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Fujitsu MBA3147RC, MBC2036RC, MBC2073RC, MBA3300RC, MBA3073RC specifications Drive Self-Test DST, Overview