Sun Microsystems 60 - page 44

3-10 Sun Ultra 60 Service Manual • August 2001
0> <1f> PBMB Control/Status Reg Test
0> <1f> PBMB Diag Reg Test
0> <00> FPU Regs Test
0> <00> FPU Move Regs Test
0> <00> FPU State Reg Test
0> <00> FPU Functional Test
0> <00> FPU Trap Test
0> <00> DMMU Primary Context Reg Test
0> <00> DMMU Secondary Context Reg Test
0> <00> DMMU TSB Reg Test
0> <00> DMMU Tag Access Reg Test
0> <00> DMMU VA Watchpoint Reg Test
0> <00> DMMU PA Watchpoint Reg Test
0> <00> IMMU TSB Reg Test
0> <00> IMMU Tag Access Reg Test
0> <00> DMMU TLB Tag Access Test
0> <00> DMMU TLB RAM Access Test
0> <00> Dcache RAM Test
0> <00> Dcache Tag Test
0> <00> Icache RAM Test
0> <00> Icache Tag Test
0> <00> Icache Next Test
0> <00> Icache Predecode Test
2> <00> FPU Regs Test
2> <00> FPU Move Regs Test
2> <00> FPU State Reg Test
2> <00> FPU Functional Test
2> <00> FPU Trap Test
2> <00> DMMU Primary Context Reg Test
2> <00> DMMU Secondary Context Reg Test
2> <00> DMMU TSB Reg Test
2> <00> DMMU Tag Access Reg Test
2> <00> DMMU VA Watchpoint Reg Test
2> <00> DMMU PA Watchpoint Reg Test
2> <00> IMMU TSB Reg Test
2> <00> IMMU Tag Access Reg Test
2> <00> DMMU TLB Tag Access Test
2> <00> DMMU TLB RAM Access Test
0> <00> CPU Addr Align Trap Test
0> <00> DMMU Access Priv Page Test
0> <00> DMMU Write Protected Page Test
0> <1f> Init Psycho
0> <1f> Pri CE ECC Error Test
0> <1f> Pri UE ECC Error Test
0> <1f> Pri 2 bit w/ bit hole UE ECC Err Test
0> <1f> Pri 3 bit UE ECC Err Test
0> <1f> Streaming DMA UE ECC Rd Err Ebus Test
CODEEXAMPLE 3-1 diag-level VariableSet to max (Continued)