Reference
Specifications (Pass/Fail Limits)
e–usss–/
]tq
This section lists each pass/fail limit name and explains how it is used. For instructions on changing the pass/fail limits and saving the changes to an SRAM card, see “Changing Pass/Fail Limits” on page 98 and “Saving/Deleting a Procedure” on page 101.
1.Carrier Feedthrough
These pass/fail limits are used in measuring the performance of the I/Q modulator of the CDMA transmitter.
Units are dBc.
2.Code Domain Floor
These pass/fail limits are used when performing code domain tests, and are used if
the Print Inactive Walsh Codes parameter is set to 1. The
Units are dB.
See Parameter "6. GN Print Inactive Walsh Codes [0=no 1=yes]" on page 111 .
3.Code Domain Phase
These pass fail limits are used when performing code domain tests. The Test Set measures the phase of a Walsh channel compared to the pilot (Walsh 0) and compares the result to these limits.
Units are mrad (milliradians).
4.Code Domain Timing
These pass/fail limits are used when performing code domain tests. The Test Set measures the time offset of a Walsh channel compared to the pilot (Walsh 0) and compares the result to these limits.
Units are ns (nanoseconds).
5.Frequency Error
These pass/fail limits are used in measuring the transmitter frequency error. The Test Software determines the transmitter center frequency and compares it with the ideal frequency, based on the channel number entry. The difference between the two is the frequency error. The calculated frequency error is then compared to these pass/fail limits to determine if the test passes or fails.
Units are Hz (hertz).
Reference |
Chapter 5 | 115 |
