Sundance Technology
ST201
PRELIMINARY draft 2
PARAMETER
SYMBOL
Twh
Twl
PARAMETER
TEST CONDITIONS
DESCRIPTION EWEN write cycle high EWEN write cycle low
EEPROM INTERFACE
MIN
100
90
MAX
-
-
UNIT
-
-
Tskc
Tskh
Tskl
Tcs
Tpd
Tcsk
Tcsh
Tdos
Tdoh
EESK cycle
EESK high
EESK low
EECS low
EEDI valid wrt EESK rise
EECS setup wrt EESK rise
EECS hold wrt EESK fall
EEDO setup wrt EESK rise
EEDO hold wrt EESK rise
MII INTERFACE - TRANSMIT
1us
250
250
250
100
50
0
70
-
-
-
-
-
-
-
-
500
500
-
-
-
-
-
-
-
-
-
Tcc
Tch
Tcl
Trv
Trh
TXCLK cycle
TXCLK high
TXCLK low
TXCLK rise to TXD, TXEN valid
TXD, TXEN hold after TXCLK rise
T = 1 when 100Mb/s; 10 when 10Mb/s
-
14T
14T
5
-
26T
26T
20
-
40T
-
-
-
MII INTERFACE - RECEIVE
Tcc
Tch
Tcl
Tsu
Thd
RXCLK cycle
RXCLK high
RXCLK low
RXD,RXER,RXDV setup wrt RXCLK rise
RXD,RXER,RXDV hold wrt RXCLK rise
T = 1 when 100Mb/s; 10 when 10Mb/s
-
14T
14T
10
5
-
26T
26T
-
-
40T
-
-
-
-
TABLE 6: Switching Characteristics
140
