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| TNETX3270 | |
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| ThunderSWITCH 24/3 ETHERNET SWITCH | |||||
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| WITH 24 | ||||||
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| SPWS043B ± NOVEMBER 1997 ± REVISED APRIL 1999 | ||
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| Terminal Functions (Continued) | ||||||||
serial MII management PHY interface | |||||||||||||||||||||||||
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| TERMINAL |
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| I/O |
| INTERNAL |
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| DESCRIPTION |
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| NAME |
| NO. |
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| RESISTOR |
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| MDCLK | 121 |
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| O/High Z |
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| Pullup | Serial MII management data clock. MDCLK can be disabled (high impedance) through the |
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| use of the SIO register. |
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| Serial MII management data I/O. MDIO can be disabled, placed in high Z, through the SIO |
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| MDIO | 120 |
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| I/O |
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| Pullup | register. An external |
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| Serial MII management reset. |
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| can be disabled (high impedance) through the use |
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| MRESET |
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| MRESET |
| 119 |
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| O/High Z |
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| Pullup | of the SIO register. If connected to a PHY device, an external pullup resistor is |
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| recommended. |
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EEPROM interface |
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| TERMINAL |
| I/O |
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| INTERNAL |
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| DESCRIPTION |
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NAME | NO. |
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| RESISTOR |
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| ECLK | 117 |
| O |
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| None |
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| EEPROM data clock. |
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| EEPROM data I/O. An external pulldown resistor may be required for proper operation. Since this |
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| EDIO | 116 |
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| Pullup |
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| terminal has an internal pullup, it can be left unconnected if no EEPROM is present. The EEPROM |
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| is optional if a management CPU is present. |
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LED interface |
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| TERMINAL |
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| I/O |
| INTERNAL |
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| DESCRIPTION |
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| NAME |
| NO. |
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| RESISTOR |
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| LEDCLK | 113 |
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| None |
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| LED clock (serial shift clock for the LED status data) |
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| LED data (serial LED status data). |
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| is active low. All LED information (port link, activity |
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| 114 |
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| None |
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| LEDDATA |
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| LEDDATA |
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| status, software status, flow status, and fault status) is sent via this serial interface. |
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JTAG interface |
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| TERMINAL |
| I/O |
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| INTERNAL |
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| DESCRIPTION |
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NAME | NO. |
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| RESISTOR |
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| TCLK | 106 |
| I |
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| Pullup |
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| Test clock. TCLK is used to clock state information, test instructions, and test data into and out of the |
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| device during operation of the test port. |
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| TDI | 110 |
| I |
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| Test data input. TDI is used to serially shift test data and test instructions into the device during |
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| operation of the test port. An internal pullup resistor is provided on TDI to ensure JTAG compliance. |
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| TDO | 108 |
| O |
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| None |
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| Test data output. TDO is used to serially shift test data and test instructions out of the device during |
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| operation of the test port. |
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| Test reset. |
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| TRST |
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| TRST |
| 111 |
| I |
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| is provided to ensure JTAG compliance. If the test port is not used, an external pulldown resistor of |
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| 10 kΩ may be used to disable the |
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| TMS | 107 |
| I |
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| Pullup |
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| is provided on TMS to ensure JTAG compliance. |
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POST OFFICE BOX 655303 •DALLAS, TEXAS 75265 | 11 |