Intel BX80646I74770K, CM8064601466200 manual Phase Locked Loop PLL Signals, Testability Signals

Models: BX80633I74960X BX80646I34130 BX80646I54430 BX80646I74770K BX80646I74770 BX80646I54570S BX80646I74770S BXF80646I74770K CM8063701159502 CM8063701212200 BX80637I73770K CM8064601466003 CM8064601466200

1 120
Download 120 pages 30.96 Kb
Page 87
Image 87
6.7Phase Locked Loop (PLL) Signals

Signal Description—Processor

6.7Phase Locked Loop (PLL) Signals

Table 37.

Phase Locked Loop (PLL) Signals

 

 

 

 

 

 

Signal Name

Description

Direction / Buffer

 

 

 

Type

 

 

 

 

 

BCLKP

Differential bus clock input to the processor

I

 

BCLKN

 

Diff Clk

 

 

 

 

 

DPLL_REF_CLKP

Embedded Display Port PLL Differential Clock In:

I

 

DPLL_REF_CLKN

135 MHz

Diff Clk

 

 

 

 

 

SSC_DPLL_REF_CLKP

Spread Spectrum Embedded DisplayPort PLL

I

 

SSC_ DPLL_REF_CLKN

Differential Clock In: 135 MHz

Diff Clk

 

 

 

 

6.8Testability Signals

Table 38.

Testability Signals

 

 

 

 

 

 

 

Signal Name

Description

Direction / Buffer

 

 

 

Type

 

 

 

 

 

 

Breakpoint and Performance Monitor Signals:

I/O

 

BPM#[7:0]

Outputs from the processor that indicate the status of

 

breakpoints and programmable counters used for

CMOS

 

 

 

 

monitoring processor performance.

 

 

 

 

 

 

 

Debug Reset: This signal is used only in systems where

 

 

DBR#

no debug port is implemented on the system board.

O

 

DBR# is used by a debug port interposer so that an in-

 

 

 

 

 

target probe can drive system reset.

 

 

 

 

 

 

 

Processor Ready: This signal is a processor output

O

 

PRDY#

used by debug tools to determine processor debug

 

Asynchronous CMOS

 

 

readiness.

 

 

 

 

 

 

 

 

PREQ#

Processor Request: This signal is used by debug tools

I

 

to request debug operation of the processor.

Asynchronous CMOS

 

 

 

 

 

 

 

 

Test Clock: This signal provides the clock input for the

I

 

TCK

processor Test Bus (also known as the Test Access

 

Port). This signal must be driven low or allowed to float

GTL

 

 

 

 

during power on Reset.

 

 

 

 

 

 

 

Test Data In: This signal transfers serial test data into

I

 

TDI

the processor. This signal provides the serial input

 

GTL

 

 

needed for JTAG specification support.

 

 

 

 

 

 

 

 

 

Test Data Out: This signal transfers serial test data out

O

 

TDO

of the processor. This signal provides the serial output

 

Open Drain

 

 

needed for JTAG specification support.

 

 

 

 

 

 

 

 

TMS

Test Mode Select: This is a JTAG specification

I

 

supported signal used by debug tools.

GTL

 

 

 

 

 

 

 

 

Test Reset: This signal resets the Test Access Port

I

 

TRST#

(TAP) logic. This signal must be driven low during power

 

GTL

 

 

on Reset.

 

 

 

 

 

 

 

Desktop 4th Generation Intel® CoreProcessor Family, Desktop Intel® Pentium® Processor Family, and Desktop Intel® Celeron® Processor Family

December 2013

Datasheet – Volume 1 of 2

Order No.: 328897-004

87

Page 87
Image 87
Intel BX80646I74770K, CM8064601466200 Phase Locked Loop PLL Signals, Testability Signals, Signal Description-Processor