Agilent Technologies 54835A Fiso failed, Probe Board failed, Offset DAC failed, Time Tag failed

Chapter 5: Troubleshooting

To troubleshoot the acquisition system

BFISO failed

When this test fails, run the Extended Service test for the A to D Converter. If any of the channels pass the extended service A to D Converter test, you can swap an A to D hybrid from a known good channel to a suspected failing channel to verify the problem, or simply replace the failing A to D hybrid with a new hybrid.

CProbe Board failed

Replace the Probe Power and Control assembly.

DOffset DAC failed

Either an Attentuator Assembly failure or Acquisition Assembly failure can cause this test to fail. If the Offset DAC test fails, first attempt to correct the failure by swapping in known good attenuator assemblies and then running the Offset DAC Service Extension. If the Offset DAC test continues to fail, exchange the acquisition assembly, which includes attenuator assemblies. Before you replace the acquisition assembly with a factory rebuilt exchange assembly, record the contact closure information for each channel onto the labels attached to each attenuator. Agilent Technologies uses this to determine when to replace the attenuators to insure quality of future exchange assemblies.

ETemperature Sense failed

Replace the acquisition assembly when this test fails. Before you replace the acquisition assembly with a factory rebuilt exchange assembly, record the contact closure information for each channel onto the labels attached to each attenuator. Agilent Technologies uses this to determine when to replace the attenuators to insure quality of future exchange assemblies.

FTrigger level failed

Replace the acquisition assembly when this test fails. Before you replace the acquisition assembly with a factory rebuilt exchange assembly, record the contact closure information for each channel onto the labels attached to each attenuator. Agilent Technologies uses this to determine when to replace the attenuators to insure quality of future exchange assemblies.

GLogic Level failed

Replace the acquisition assembly when this test fails. Before you replace the acquisition assembly with a factory rebuilt exchange assembly, record the contact closure information for each channel onto the labels attached to each attenuator. Agilent Technologies uses this to determine when to replace the attenuators to insure quality of future exchange assemblies.

HPattern Trigger failed

Replace the acquisition assembly when this test fails. Before you replace the acquisition assembly with a factory rebuilt exchange assembly, record the contact closure information for each channel onto the labels attached to each attenuator. Agilent Technologies uses this to determine when to replace the attenuators to insure quality of future exchange assemblies.

IState Trigger failed

Replace the acquisition assembly when this test fails. Before you replace the acquisition assembly with a factory rebuilt exchange assembly, record the contact closure information for each channel onto the labels attached to each attenuator. Agilent Technologies uses this to determine when to replace the attenuators to insure quality of future exchange assemblies.

JTime Tag failed

Replace the acquisition assembly when this test fails. Before you replace the acquisition assembly with a factory rebuilt exchange assembly, record the contact closure information for each channel onto the labels attached to each attenuator. Agilent Technologies uses this to determine when to replace the attenuators to insure quality of future exchange assemblies.

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