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Agilent Technologies 66309B, D, 66311B, 66111A manual MEASureVOLTageLOW? FETChVOLTageLOW?, 110

Models: 66111A 66309B 66311B D

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8 – Language Dictionary

MEASure:VOLTage:LOW?

FETCh:VOLTage:LOW?

Agilent 66311B/D, 66309B/D only

These queries return the Low level voltage of a voltage pulse waveform. The instrument first measures the minimum and maximum data points of the pulse waveform. It then generates a histogram of the pulse waveform using 16 bins between the maximum and minimum data points. The bin containing the most data points below the 50% point is the low bin. The average of all the data points in the low bin is returned as the Low level. If no low bin contains more than 1.25% of the total number of acquired points, then the minimum value is returned by these queries.

Query Syntax

MEASure[:SCALar]:VOLTage:LOW?

 

FETCh[:SCALar]:VOLTage:LOW?

Parameters

None

 

Examples

MEAS:VOLT:LOW?

FETC:VOLT:LOW?

Returned Parameters

<NR3>

 

Related Commands

MEAS:VOLT:HIGH?

CALC:REF:LOW

MEASure:VOLTage:MAXimum?

FETCh:VOLTage:MAXimum?

Agilent 66311B/D, 66309B/D only

These queries return the maximum output voltage.

Query Syntax

MEASure[:SCALar]:VOLTage:MAXimum?

 

FETCh[:SCALar]:VOLTage:MAXimum?

Parameters

None

 

Examples

MEAS:VOLT:MAX?

FETC:VOLT:MAX?

Returned Parameters

<NR3>

 

Related Commands

MEAS:VOLT:MIN?

 

MEASure:VOLTage:MINimum?

FETCh:VOLTage:MINimum?

Agilent 66311B/D, 66309B/D only

These queries return the minimum output voltage..

Query Syntax

MEASure[:SCALar]:VOLTage:MINimum?

 

FETCh[:SCALar]:VOLTage:MINimum?

Parameters

None

 

Examples

MEAS:VOLT:MIN?

FETC:VOLT:MIN?

Returned Parameters

<NR3>

 

Related Commands

MEAS:VOLT:MAX?

 

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Agilent Technologies 66309B, D manual MEASureVOLTageLOW? FETChVOLTageLOW?, MEASureVOLTageMAXimum? FETChVOLTageMAXimum?, 110
Page 109 Page 111

66111A, 66309B, 66311B, D specifications

Agilent Technologies D,c,83440b is an advanced electronic measurement solution designed for engineers and scientists who require precise and reliable performance in their testing environments. This modular test system offers a comprehensive suite of features that cater to a wide range of applications, from high-frequency testing to complex signal analysis.

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In addition to its frequency capabilities, Agilent Technologies has engineered the D,c,83440b with exceptional dynamic range and low noise figures. This ensures that even the smallest signals can be accurately measured, allowing for greater precision in testing. The full spectrum analysis feature enables users to capture transient events and analyze them in real-time, which is crucial for troubleshooting and performance evaluations.

The D,c,83440b is built on a modular platform, allowing users to customize their systems according to specific testing needs. This modularity not only enhances flexibility but also simplifies maintenance and upgrades. Users can easily swap out different modules without the need for extensive system reconfiguration, which can significantly reduce downtime in testing environments.

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The integration of advanced digital signal processing technologies further enhances the capabilities of the D,c,83440b. These technologies enable more sophisticated measurements and improved signal integrity, which is essential for modern communication systems.

In summary, the Agilent Technologies D,c,83440b is a multifaceted electronic measurement solution that boasts a wide frequency range, excellent dynamic range, modular design, and user-friendly interface. This combination of features makes it suitable for various applications, ensuring that engineers and scientists have the tools they need to succeed in their testing and measurement endeavors.