Programming the DC Source - 7

Returning All Measurement Data From the Data Buffer

The MEASure:ARRay and FETCh:ARRay queries return all data values of the instantaneous voltage or current buffer. No weighting function is applied, returning only raw data from the buffer. The commands are:

MEAS:ARR:CURR?

MEAS:ARR:VOLT?

Making DVM Measurements

Agilent Models 66311D and 66309D have a DVM input on the rear panel for making independent voltage measurements. The common mode voltage range of the DVM is −4.5 V to +25 V from either DVM input with respect to the negative output terminal of output 1. To protect the DVM from damage, keep the maximum isolation voltage to ground at less than ±50 Vdc. To obtain correct voltage measurements, keep the common mode voltage within the specified limits. Refer to chapter 3 under "DVM Connection" for more information.

The DVM can only measure average and rms voltage. Its measurement parameters are not programmable. They are fixed at 2048 data points with a 15.6 microsecond sampling rate using a Hanning window. Use the SCPI language MEASure and FETCh queries to return measurements. Note that all triggered measurement functions discussed the next section also apply to DVM measurements.

NOTE: There is only one measurement system in the dc source. Therefore, you can perform only one measurement function (voltage, current, or DVM) at a time.

Average Measurements

To measure the average voltage, use:

MEAS:DVM:DC?

Average voltage measured by acquiring a number of readings at the selected time interval, applying a Hanning window function to the readings, and averaging the readings. Windowing is a signal conditioning process that reduces the error in average measurements made in the presence of periodic signals. The DVM sampling rate and sweep size result in a data acquisition time of 32 milliseconds per measurement. Adding a command processing overhead of about 20 milliseconds results in a total measurement time of about 50 milliseconds per measurement.

RMS Measurements

To measure rms voltage, use:

MEAS:DVM:ACDC?

This returns the total rms measurement. If ac and dc are present, the DVM measures the total rms of ac+dc.

Making rms or average measurements on ac waveforms for which a non-integral number of cycles of data has been acquired may result in measurement errors due to the last partial cycle of acquired data. This error is reduced by using a Hanning window function when making the measurement.

83

Page 82 Page 84
Page 83
Image 83
Agilent Technologies 66111A, 66311B, 66309B Making DVM Measurements, Returning All Measurement Data From the Data Buffer
Page 82 Page 84

66111A, 66309B, 66311B, D specifications

Agilent Technologies D,c,83440b is an advanced electronic measurement solution designed for engineers and scientists who require precise and reliable performance in their testing environments. This modular test system offers a comprehensive suite of features that cater to a wide range of applications, from high-frequency testing to complex signal analysis.

One of the main features of the D,c,83440b is its impressive frequency range, allowing users to conduct tests across a wide spectrum of signals. The system is capable of handling frequencies up to 26.5 GHz, making it ideal for RF and microwave applications. This broad range ensures that users can work with a variety of devices, including communication systems, radar, and satellite technology.

In addition to its frequency capabilities, Agilent Technologies has engineered the D,c,83440b with exceptional dynamic range and low noise figures. This ensures that even the smallest signals can be accurately measured, allowing for greater precision in testing. The full spectrum analysis feature enables users to capture transient events and analyze them in real-time, which is crucial for troubleshooting and performance evaluations.

The D,c,83440b is built on a modular platform, allowing users to customize their systems according to specific testing needs. This modularity not only enhances flexibility but also simplifies maintenance and upgrades. Users can easily swap out different modules without the need for extensive system reconfiguration, which can significantly reduce downtime in testing environments.

Another standout characteristic of the D,c,83440b is its user-friendly interface. With a large, high-resolution display and intuitive controls, engineers can quickly navigate through settings and data, streamlining the testing process. This ease of use is complemented by powerful software solutions that can automate test sequences, aiding in efficiency and accuracy.

The integration of advanced digital signal processing technologies further enhances the capabilities of the D,c,83440b. These technologies enable more sophisticated measurements and improved signal integrity, which is essential for modern communication systems.

In summary, the Agilent Technologies D,c,83440b is a multifaceted electronic measurement solution that boasts a wide frequency range, excellent dynamic range, modular design, and user-friendly interface. This combination of features makes it suitable for various applications, ensuring that engineers and scientists have the tools they need to succeed in their testing and measurement endeavors.
Top Page Image Contents