7 - Programming the DC Source

When the instrument is turned on and at *RST, the output voltage or current sampling rate is 15.6 microseconds, and the sweep size is set to 2048 data points. This means that it takes about 32 milliseconds to fill up 2048 data points in the data buffer. Adding a command processing overhead of about 20 milliseconds results in a total measurement time of about 50 milliseconds per measurement. You can vary this data sampling rate with:

SENS:SWE:TINT <sample_period>

SENS:SWE:POIN <points>

For example, to set the time interval to 46.8 microseconds per measurement with 1500 samples, use

SENS:SWE:TINT 46.8E-6;POIN 1500.

Note that reducing the number of sample points increases the speed of the measurement; however, the tradeoff is greater measurement uncertainty in the presence of noise..

Window Functions

The dc source lets you select from two measurement window functions: Hanning and Rectangular. To select a window function, use:

SENS:WIND: HANN RECT

As shipped from the factory, the dc source measurement functions use a Hanning window. The Hanning window applies a cos4 weighting function to the data in the measurement buffer when computing average and rms measurements. This returns accurate data even if an integral number of waveform cycles are not captured, provided that at least three or more waveform cycles are in the measurement buffer. If there are only one or two waveform cycles, the Hanning window will not give accurate results.

With a Rectangular window, no weighting function is applied to the data in the measurement buffer. However, to use the Rectangular window function to return accurate data for one or more waveform cycles, an integral number of waveform cycles must be captured in the measurement buffer. This means that you must accurately know the waveform period beforehand. In this way you can chose the sample interval and the number of data points so that an integral number of waveform cycles will end up in the measurement buffer.

Measuring Output 2 Voltage and Current (Agilent 66309B/D only)

The measurement parameters for output 2 are not programmable. They are fixed at 2048 data points with a 15.6 microsecond sampling rate using a Hanning window. To measure the average output voltage or current for output 2, use:

MEAS:VOLT2?

MEAS:CURR2?

Making Enhanced Measurements

Agilent Models 66311B, 66311D, 66309B, and 66309D have the ability to make several types of voltage or current waveform measurements. These expanded measurement capabilities are particularly useful for loads that draw current in pulses. The SCPI language MEASure and FETCh queries are used to return the various measurement parameters of voltage and current waveforms.

80

Page 80
Image 80
Agilent Technologies D, 66311B, 66309B, 66111A manual Making Enhanced Measurements, Window Functions

66111A, 66309B, 66311B, D specifications

Agilent Technologies D,c,83440b is an advanced electronic measurement solution designed for engineers and scientists who require precise and reliable performance in their testing environments. This modular test system offers a comprehensive suite of features that cater to a wide range of applications, from high-frequency testing to complex signal analysis.

One of the main features of the D,c,83440b is its impressive frequency range, allowing users to conduct tests across a wide spectrum of signals. The system is capable of handling frequencies up to 26.5 GHz, making it ideal for RF and microwave applications. This broad range ensures that users can work with a variety of devices, including communication systems, radar, and satellite technology.

In addition to its frequency capabilities, Agilent Technologies has engineered the D,c,83440b with exceptional dynamic range and low noise figures. This ensures that even the smallest signals can be accurately measured, allowing for greater precision in testing. The full spectrum analysis feature enables users to capture transient events and analyze them in real-time, which is crucial for troubleshooting and performance evaluations.

The D,c,83440b is built on a modular platform, allowing users to customize their systems according to specific testing needs. This modularity not only enhances flexibility but also simplifies maintenance and upgrades. Users can easily swap out different modules without the need for extensive system reconfiguration, which can significantly reduce downtime in testing environments.

Another standout characteristic of the D,c,83440b is its user-friendly interface. With a large, high-resolution display and intuitive controls, engineers can quickly navigate through settings and data, streamlining the testing process. This ease of use is complemented by powerful software solutions that can automate test sequences, aiding in efficiency and accuracy.

The integration of advanced digital signal processing technologies further enhances the capabilities of the D,c,83440b. These technologies enable more sophisticated measurements and improved signal integrity, which is essential for modern communication systems.

In summary, the Agilent Technologies D,c,83440b is a multifaceted electronic measurement solution that boasts a wide frequency range, excellent dynamic range, modular design, and user-friendly interface. This combination of features makes it suitable for various applications, ensuring that engineers and scientists have the tools they need to succeed in their testing and measurement endeavors.