LGA1155 Socket and ILM Electrical, Mechanical and Environmental Specifications

Figure 5-1. Flow Chart of Knowledge-Based Reliability Evaluation Methodology

Establish the market/expected use environment for the technology

Freeze stressing requirements and perform additional data turns

Develop Speculative stress conditions based on historical data, content experts, and literature search

Perform stressing to validate accelerated stressing assumptions and determine acceleration factors

A detailed description of this methodology can be found at: ftp://download.intel.com/ technology/itj/q32000/pdf/reliability.pdf.

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Thermal/Mechanical Specifications and Design Guidelines