Samsung S3C84E5 user manual Subsystem Oscillator crystal Stabilization Time tST2, Xtin, 17-7

S3C84E5/C84E9/P84E9	ELECTRICAL DATA
	1/fOSC1
tXL	tXH
XIN	VDD - 0.5 V
	0.4 V

Figure 17-3. Clock Timing Measurement at XIN

Table 17-7. Sub Oscillator Frequency (fOSC2)

(T

A

= –25 °C + 85 °C, V

DD

= V

LVR

to 5.5 V)

Oscillator

Clock Circuit

Test Condition

Min

Typ.

Max

Unit

Crystal

XTIN

XTOUT

Crystal oscillation frequency

32

32.768

34

kHz

C1 = 100 pF, C2 = 100 pF

RR = 330 Ω

XTIN and XTOUT are connected

C1 C2 with R and C by soldering.

Table 17-8. Subsystem Oscillator (crystal) Stabilization Time (tST2)

(TA = 25 °C)

Oscillator			Test Condition	Min	Typ.	Max	Unit
Normal mode	VDD = 4.5 V to 5.5 V			–	800	1600	ms
	VDD = VLVR	to	3.3 V	–		10	s
Strong mode	VDD = 4.5 V to 5.5 V			–	400	800	ms
	VDD = VLVR	to	3.3 V	–	150	300

NOTE: Oscillation stabilization time (tST2) is the time required for the oscillator to it's normal oscillation when stop mode

is released by interrupts. The value Typ. and Max are measured by buzzer output signal after stop release.

For example in voltage range of 4.5 V to 5.5 V of normal mode, we can see the buzzer output signal within 400 ms at our test condition.

17-7