S3C84E5/C84E9/P84E9

ELECTRICAL DATA

 

1/fOSC1

tXL

tXH

XIN

VDD - 0.5 V

 

0.4 V

Figure 17-3. Clock Timing Measurement at XIN

 

 

 

 

 

 

Table 17-7. Sub Oscillator Frequency (fOSC2)

 

 

 

(T

A

= –25 °C + 85 °C, V

DD

= V

LVR

 

to 5.5 V)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Oscillator

Clock Circuit

Test Condition

Min

Typ.

Max

Unit

Crystal

 

XTIN

XTOUT

 

Crystal oscillation frequency

32

32.768

34

kHz

 

 

 

 

 

 

 

C1 = 100 pF, C2 = 100 pF

 

 

 

 

RR = 330 Ω

XTIN and XTOUT are connected

C1 C2 with R and C by soldering.

Table 17-8. Subsystem Oscillator (crystal) Stabilization Time (tST2)

(TA = 25 °C)

Oscillator

 

 

Test Condition

Min

Typ.

Max

Unit

Normal mode

VDD = 4.5 V to 5.5 V

800

1600

ms

 

VDD = VLVR

to

3.3 V

 

10

s

Strong mode

VDD = 4.5 V to 5.5 V

400

800

ms

 

VDD = VLVR

to

3.3 V

150

300

 

NOTE: Oscillation stabilization time (tST2) is the time required for the oscillator to it's normal oscillation when stop mode

is released by interrupts. The value Typ. and Max are measured by buzzer output signal after stop release.

For example in voltage range of 4.5 V to 5.5 V of normal mode, we can see the buzzer output signal within 400 ms at our test condition.

17-7

Page 296
Image 296
Samsung S3C84E5 user manual Subsystem Oscillator crystal Stabilization Time tST2, Xtin, 17-7