Toshiba TECRA S1 manual Memory Test Diagnostic Programs, Subtest 03 Extended Pattern

3.6 Memory Test 3 Diagnostic Programs

1.Bit Stuck High Test

Data pattern: Every bit is ‘1’ (Each bit is high)

2.Bit Stuck Low Test

Data pattern: Every bit is ‘0'(Each bit is low);

3.Checker Board Test

Data pattern: Lo-byte and hi-byte are composed with 0101(0x5) and 1010 (0xA);

4.CAS Line Test

Data pattern: Lo-byte and hi-byte are composed with 0000 (0x0) and 1111(0xF);

5.Incremental Test

Data pattern: A series of increasing data from 0 by adding 1 each time;

6.Decrement Test

Data Pattern: A series of decreasing data from the maximum (e.g. 0xFFFF) by subtracting 1 each time;

7.Incremental / Decrement Test

Data Pattern is a series of data whose low byte is increasing data from 0x00 and high byte is decreasing data from 0xFF.

Subtest 03 Extended Pattern

In addition to the above pattern test with the memory, there are Read/Write Cycle test and Read Cycle Test for the extended memory.

Below is the parameter dialog window of the extended pattern test.

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