DATASHEET
PM5349 S/UNI-QUAD
ISSUE 6 | SATURN USER NETWORK INTERFACE | |
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13.6.1.1States
Test-Logic-Reset
The test logic reset state is used to disable the TAP logic when the device is in normal mode operation. The state is entered asynchronously by asserting input, TRSTB. The state is entered synchronously regardless of the current TAP controller state by forcing input, TMS high for 5 TCK clock cycles. While in this state, the instruction register is set to the IDCODE instruction.
Run-Test-Idle
The run test/idle state is used to execute tests.
Capture-DR
The capture data register state is used to load parallel data into the test data registers selected by the current instruction. If the selected register does not allow parallel loads or no loading is required by the current instruction, the test register maintains its value. Loading occurs on the rising edge of TCK.
Shift-DR
The shift data register state is used to shift the selected test data registers by one stage. Shifting is from MSB to LSB and occurs on the rising edge of TCK.
Update-DR
The update data register state is used to load a test register's parallel output latch. In general, the output latches are used to control the device. For example, for the EXTEST instruction, the boundary scan test register's parallel output latches are used to control the device's outputs. The parallel output latches are updated on the falling edge of TCK.
Capture-IR
The capture instruction register state is used to load the instruction register with a fixed instruction. The load occurs on the rising edge of TCK.
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