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Agilent Technologies 16760A manual What is a Characteristic?, What is a Function Test?, 237

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Chapter 5: Reference

Specifications and Characteristics

referred to as an "operational accuracy calibration".

What is a Function Test?

What is a Characteristic?

Characteristics describe product performance that is useful in the application of the product, but that is not covered by the product warranty. Characteristics describe performance that is typical of the majority of a given product, but not subject to the same rigor associated with specifications.

Characteristics are verified by Function Tests.

Function tests are quick tests designed to verify basic operation of a product. Function tests include operator's checks and operation verification procedures. An operator's check is normally a fast test used to verify basic operation of a product. An operation verification procedure verifies some, but not all, specifications, and often at a lower confidence level than a calibration procedure.

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Agilent Technologies 16760A manual What is a Characteristic?, Referred to as an operational accuracy calibration, 237

Contents

Agilent Technologies. All rights reserved Agilent Technologies 16760A Logic AnalyzerSampling Mode on Captures input signals as low as 200 mV p-pAgilent Technologies 16760A Logic Analyzer ProbingConcepts on Reference onGlossary see See AlsoContents Choosing the Sampling Mode 110 Using Symbols 101112 114152 Displaying Captured Eye Scan Data155 Format Tab 174Eye Scan Tab 204 210211 Specifications and Characteristics 240259 Glossary Index Contents Getting Started Eye scan sampling mode, measurements will have these steps Probing and Sampling Mode Selection Steps Next . Choose the sampling mode onConnect logic analyzer to the device under test To choose the sampling mode Choose the sampling modeIf you chose State Mode If you chose Timing ModeNext . Format labels for the probed signals on Either Timing Mode or State ModeIf you chose Eye Scan Mode Format labels for the probed signals To specify threshold voltages To assign pods to the logic analyzerNext Defined threshold voltage Select the Close buttonTo assign names to logic analyzer channels Define the trigger condition Timing Mode or State Mode StepsNext . Run the measurement on Run the measurementDisplay the captured data Next . Display the captured data onTo open Waveform or Listing displays To add display tools via the Workspace window Next For More Information... onSelect channels for the eye scan measurement Eye Scan Mode StepsNext . Set the eye scan range and resolution on Set the eye scan range and resolutionNext . Run the eye scan measurement on Run the eye scan measurementNext . Display the captured eye scan data on Display the captured eye scan dataEye Scan display window, use the following subtabs For More Information For More Information Probing and Selecting the Sampling Mode Probing and Selecting the Sampling Mode Probing the Device Under Test Using the E5378A Single-Ended ProbeNumber Single-ended signalNumbers EitherUsing the E5379A Differential Probe Independent threshold adjustment Or single-ended signalsNegative data inputs Reference voltageOr AMP Using the E5380A Mictor-Compatible ProbeUsing the E5382A Single-ended Flying Lead Probe Set Additional Accessories Using an Analysis ProbeProbing the Device Under Test Selecting the Timing Mode Asynchronous Sampling Choosing the Sampling ModeTo select the conventional/transitional configuration To select the timing modeSample rate is the inverse of the sample period To specify the sample periodState Mode Sampling Position Selecting the State Mode Synchronous SamplingTo automatically adjust sampling positions on To manually adjust sampling positions onTo select the state speed configuration To select the state modeFor the clock input signal that will be used To set up the sampling clockTo automatically adjust sampling positions Automatically sets the sampling positionRun simultaneously To run eye finder repetitively Choose the labels that you wish to run eye finder onTo view eye finder data as a bus composite To view eye finder data as a stack of channelsTo save/load eye finder data To manually adjust sampling positions Eye Finder Advanced Settings Dialog onEye finder data must be saved and loaded separately Either Timing Mode or State Mode To specify the trigger positionTo set acquisition memory depth To turn an analyzer off or on To name an analyzerYou can give more descriptive names to a logic analyzer You can also name analyzers in the Pod Assignment Dialog onTo select the eye scan mode Selecting the Eye Scan ModeTo select the eye scan mode speed configuration High-speed or high-bandwidth oscilloscopeTo set up the eye scan mode reference clock Format tab has activity indicators that show signal levels Formatting Labels for Logic Analyzer ProbesTo assign pods to the analyzer Capturing Data on 17 Channels in State Mode To set up qualified eye scan measurements onTo set pod threshold voltages To set clock threshold voltages To assign probe channels to labels Maximum of 32 channels can be assigned to a label Label offTo delete labels To import label names and assignments from a netlist SignalsE5378A and E5380A probe types to be selectable LabelTo import label definitions from an Ascii file To assign label name Blue to channel 5 on pod A2Label Definition File Format Examples To export label definitions to an Ascii file To change the label polarityChannel 5 on pod A2, and channel 6 on pod A1 To reorder bits in a label Changing the label polarity will have the following effectsChanging the label polarity does not affect To turn a label off To turn labels off or onTo turn a label on To display a label that was offUsing the Logic Analyzer in Timing or State Mode Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements Use trigger functions for basic measurementsGeneral To select a trigger function Using Trigger FunctionsTo specify a label pattern event Timing only To specify a label edge event To enter symbolic label values on Symbols Selector Dialog onTo compress a trigger function To expand a trigger functionTo copy trigger function libraries between systems To load/unload trigger function librariesTo count time, states, or turn counting off Using Other Trigger FeaturesTo assign pods to the analyzer on To specify default storingReduced by half in order to store the required time tags If you chose CustomTo clear default storing changes Trigger tabs Default Storing subtab, select the At start Default storing is initially on or offTo insert a store action state mode on Acquisition option button and choose either On or OffTo clear the trigger sequence on To insert/replace/delete sequence levelsTo insert sequence levels To replace sequence levelsTo cut/copy-and-paste sequence levels Setting Up Triggers and Running Measurements Example system14 Slot C Analyzer C has triggered To view a picture of the trigger sequence To restore default trigger settingsTo clear the trigger sequence Trigger tab, select the Overview subtabTo specify a time duration for events timing only To specify a duration or occurrence count for eventsTo insert timer actions/events To insert a store action state modeTo insert a timer action AvailableTo insert counter actions/events To insert a timer eventTo insert a counter action To insert a counter eventTo insert flag actions/events To insert a flag event To drive the Port Out signal with a flagTo insert a reset occurrence counter action To group eventsTo use named events To save a trigger setup Saving/Recalling Trigger SetupsTo give an event list a name To insert a named eventRunning Measurements To recall a trigger setupTo clear the trigger save/recall list To start/stop measurementsTo stop a measurement If nothing happens when you start a measurementSelect the Stop or Stop All button Waiting for Trigger onTo view the trigger status To open Waveform or Listing displays Displaying Captured DataTo use other display tools Help volumeWindows Search for particular data values captured on labelsDisplaying Captured Data Intermittent Data Errors Unwanted Triggers Analyzer help volumeIf the captured data doesnt look correct Into parallel words which are easier to view and analyzeThis situation will occur in these cases If there are filtered data holes in display memoryTo display symbols for data values To view symbolic values in a waveform displayTo view symbolic values in a listing display To cancel the display processing of captured data Select the Cancel button100 Using Symbols You can use symbol names in place of data values when101 To load object file symbols To reload object file symbols102 Object file symbols are reloaded To adjust symbol values for relocated codeWhose symbols you wish to relocate To create user-defined symbolsTo replace user-defined symbols 104When entering label values in the trigger sequence To enter symbolic label valuesTo delete user-defined symbols To load user-defined symbolsTo create an Ascii symbol file General-Purpose Ascii GPA Symbol File Format on106 Create the reader.ini file on your workstation or PC ReadOnlyTicoffPage StabsTypeAppendTicoffPage Examples Example for Elf/StabsExample for Coff/Stabs using Ticoff reader Example for Ticoff109 You can print captured data from display tool windows Printing/Exporting Captured DataSelect the Read File button Select the file name and automatic file sequencing optionsIcon to view the imported data 111Cross-Triggering To cross-trigger with another instrument112 113 When the logic analyzer drives the arm signalTo test the logic analyzer hardware Solving Logic Analysis ProblemsTo test the logic analyzer hardware on 114Service Center for assistance System help volume115 To save logic analyzer configurations Saving and Loading Logic Analyzer ConfigurationsTo load logic analyzer configurations 116117 Using the Logic Analyzer in Eye Scan Mode118 Eye Scan tab lets you set up and run Eye Scan measurements Setting Up and Running Eye Scan MeasurementsTo select channels for the eye scan 119To set the eye scan range and resolution Scan Settings Subtab on120 To run an eye scan measurement To quickly set up another measurement using the scale seeTo set advanced eye scan options 121To set up qualified eye scan measurements Advanced Subtab on122 Requirements Signal Timing Burst Transfers Memory device versus a memory controller123 Burst Has adjustable sampling positions on each input channelAfter the rising edge of the clock Before the clock edge to after itClock cycle of the next burst Are supported125 126 127 Be sure that the thresholds are set correctlyNot already expanded For correct state mode acquisitionsStart your target system and select Run Eye Finder Display129 Now, set up eye scan mode130 Select the Eye Scan tab Select the Qualifier subtab131 Select the Qualify eye scan sampling using... buttonTo comment on the eye scan settings Displaying Captured Eye Scan Data To open the Eye Scan display133 Tool To select the channels displayedWithin the data captured on the bus 134Scale tab, you can To scale the Eye Scan displayTo use the scaling options Eye Scan display window, select the Scale tabTo set Eye Scan display options To quickly set up another measurement using the scaleTo clear the captured eye scan data To open the Eye Scan display on137 138 139 140 To change the Eye Scan color scaleIs zero by default Make measurements on the eye scan data on141 To make measurements on the eye scan data About the captured measurement data142 143 144 145 146 147 148 Scroll bars to navigate through the information To display information about the eye scan dataEye Scan display window, select the Info tab 149150 Info tab, you can151 To comment on the eye scan dataLoading Logic Analyzer Configurations on Saving and Loading Captured Eye Scan Data152 153 Sampling Tab on Format Tab on Trigger Tab on154 Sampling Tab Sampling tab lets you choose between the logic analyzers155 Conventional Transitional Timing ModeAcquisition 156Will be stored How Samples are Stored in Transitional TimingPeriod and other times more than two sample periods apart Samples with transitionsState Mode State Speed158 159 Sampling Positions DialogSampling Positions Tab File menu Lets you save/load eye finder data160 Display Area Label buttonsSampling Position 161How the Suggested Position Behaves How the Selected Position BehavesXX% complete Cannot run the Eye Finder at this timeCharacterizer cannot be loaded Cannot run the Logic Analyzer at this timeComplete Date 163Select one or more labels in the Eye Finder Setup tab This channel appears to be completely quiet Timeout N K clocks in 5 secTwo common possibilities exist 165See individual channels for messages Run Eye Finder to characterize this channelStable region extends beyond the limits of the display 166Disk is probably full Numerical value for the item XXX could not be readFile Name already exists. Overwrite? Failed to open file for reading/writing NameInvalid true/false flag Unsupported revision level AA.BB169 Eye Finder Setup Tab170 Eye Finder Advanced Settings Dialog171 File Info TabReload Eye Scan ModeSave Save As173 Selecting the Eye Scan Mode onFormat Tab Expander cards which cannot be used in the clock setupData Specify the logic analyzer pod and clock threshold voltagesName Pod Assignment DialogType Pods176 Trigger Tab177 Trigger Functions Subtab178 General Timing Trigger Functions179 180 General State Trigger Functions181 Find pattern1 eventually followed by pattern2182 183 Advanced Trigger Functions184 State Trigger Functions Turbo State Trigger FunctionsAdvanced pattern1 or pattern2 Searched for186 187 Half Channel State Trigger FunctionsCount Settings SubtabIntermodule Control 188Overview Subtab This tab gives a picture of the trigger sequence189 Event Specification List Default Storing SubtabAt start Acquisition Group eventsStatus Subtab Save/Recall Subtab191 192 Creating trigger function librariesTwo kinds of symbols are available Symbols TabThat you use to set up resource terms Multiple files194 Object file versions See AlsoSymbols Selector Dialog Matching Symbols195 Search Pattern Offset By OptionAddress masking is done by the Align to x Byte option Align to x Byte Option Symbol File FormatsByte option allows you to mask off an address Qualifies any address from 100C through 100FGeneral-Purpose Ascii GPA Symbol File Format 107 file198 GPA Record Format Summary Format199 Records Definitions in the file200 Symbol representing the function name Symbol representing the name of the sectionFirst address of the section, in hexadecimal Last address of the section, in hexadecimalName of a file You can specify symbols for variables usingNumber of a line in the file, in decimal 202203 CommentsLabels Subtab Eye Scan TabExpand Collapse Shows labels only Select All Selects all channelsRun Mode Scan Settings SubtabScan Range Time206 Advanced SubtabMedium ShortLong CustomQualification Qualifier SubtabClock Edge to Sample Names for209 Comments SubtabCalibration Instructions Calibration TabCalibration Status Calibration Messages211 Error MessagesBranch expression is too complex General Guidelines212 213 Specific Guidelines 200 Mb/s State and all Timing ModesThis one may If the following sequence does not compileSpecific Guidelines 400 Mb/s State Modes 214215 Specific Guidelines 800 Mb/s State Mode Specific Guidelines 1250/1500 Mb/s State Mode216 217 Hardware Initialization Failed Goto action specifies an undefined levelPossible Causes Last sequence level calls goto nextMust assign another pod pair to specify actions for flags Maximum of 32 Channels Per LabelNo more Edge/Glitch resources available for this pod pair Timing sampling mode, flags are are always availableNo more Pattern resources available for this pod pair Possible SolutionsPhrase some of the edges as patterns 220No Trigger action found in the trace specification Slow or Missing Clock221 222 Trigger function initialization failureTrigger Specification is too complex Trigger inhibited during timing prestoreThen the approximate time is 32 seconds 223Combiner resource allocation guidelines Event224 Waiting for Trigger Misaligned boundaries for addresses225 226 To save a trigger setup onOperating temperature 0 to 45 degrees C Specifications and CharacteristicsProbes 227E5379A Differential Probe Specifications Characteristics E5378A Single-Ended Probe Specifications CharacteristicsAll specifications are marked by * asterisk E5378A Input Equivalent Circuit229 E5379A Input Equivalent Circuit1500 Mb/s Sampling Mode Specifications and Characteristics E5380A Input Equivalent Circuit230 231 Characteristics232 233 400 Mb/s Sampling Mode Specifications Characteristics234 200 Mb/s Sampling Mode Specifications CharacteristicsTransitional Timing Mode Specifications and Characteristics Conventional Timing Mode Specifications and CharacteristicsAll specifications are marked by * asterisk 235236 What is a Specification?What is a Function Test? What is a Characteristic?Referred to as an operational accuracy calibration 237238 239 ConceptsUnderstanding Logic Analyzer Triggering Conveyor Belt Analogy240 241 Conveyor belt analogySequence Levels Summary of Triggering CapabilitiesNext Summary of Triggering Capabilities on Next Sequence Levels on243 Addr Data 244Boolean Expressions Edges BranchesRanges Next Ranges onOccurrence Counters and Global Counters FlagsNext Flags on Trigger Sequence for ModuleNext Timers on TimersAn example trigger sequence to set up this measurement is An edge followed by an edge with a time limitStorage Qualification Default StorageNext Storage Qualification on Needed250 Sequence Level StorageNext Strategies for Setting Up Triggers on Strategies for Setting Up TriggersTrigger Functions 251Agilent 16715A trigger user interface Pattern2 occurring immediately after Pattern1252 Same trigger as If/Then statements Store range until pattern occurs253 Next Setting Up Complex Triggers on Setting Up Complex TriggersDocument Your Trigger Sequences Next Document Your Trigger Sequences onDifferent parts of the trigger to describe how they work ConclusionsNext Conclusions on Inline documentation on an Agilent logic analyzerUnderstanding State Mode Sampling Positions To accurately capture data on a bus256 257 258 Window259 Understanding Eye Scan Measurements260 261 Using the Logic Analyzer in Eye Scan Mode on Voltage resolution that can be set is 1 mVAre multiple logic analyzer cards in a module in this case Measurements run simultaneously in parallelGlossary Asterisk * See edge terms, glitch, and labels263 264 Divided into 1K 64-state records265 Debug mode See monitor266 Ethernet address See link-level267 268 269 Module/probe interconnect cableBy the channel width of the instrument Processor probe See emulation270 271 Measurements272 273 274 275 Index251 276247 277122 278180 279280 Label values, symbolic, 105 labels, 22Positive logic 281242 282107 283Wait for other machine to trigger 284Publication Number 5988-9044EN January 1