Agilent Technologies 16760A - page 278

278

Index

exporting label definitions to an

ASCII file, 64

expressions, boolean, 245

external reference (threshold

voltage), 35

external reference threshold

voltage, 58

eye finder, 46, 49, 169, 256

eye finder advanced settings, 170

eye finder data, 116

eye finder selected/suggested

sampling positions, 161

eye limits tool (eye scan display),

142

eye scan comments subtab, 209

eye scan data, commenting on, 151

eye scan data, displaying, 133

eye scan data, information about,

149

eye scan data, loading, 152

eye scan data, measurements on,

142

eye scan data, saving, 152

Eye Scan display options, 136

Eye Scan display settings, 140

Eye Scan display, measurements,

142

Eye Scan display, opening, 133

Eye Scan display, scaling, 135

Eye Scan display, selecting

channels, 134

Eye Scan display, zoom, 135

eye scan getting started, displaying

the captured data, 30

eye scan getting started, running

the measurement, 29

eye scan getting started, selecting

channels, 26

eye scan getting started, setting

range and resolution, 27

eye scan labels subtab, 204

eye scan measurement, running,

121

eye scan measurements,

understanding, 259

eye scan mode, 16

eye scan mode controls, 16

eye scan mode reference clock, 172

eye scan mode reference clock,

setting up, 56

eye scan mode speed

configuration, 55

eye scan mode, selecting, 55

eye scan options, advanced, 121,

206

eye scan range, setting, 120

eye scan resolution, setting, 120

eye scan sampling mode, 43, 55

eye scan settings subtab, 205

eye scan settings, commenting on,

132

eye scan settings, qualified scan,

122

eye scan setup using display scale,

135

Eye Scan tab, 204

eye scan, on DDR target system,

122

eye scan, running measurements,

119

eye scan, selecting channels for,

119

eye scan, setting up, 119, 122

F

Feedthrough type, Port Out, 87

File In tool, 110

File Out tool, 110

file versions, 102

files, 102

files, ASCII label definitions, 63, 64

Find 2 edges too close together

trigger function, 179

Find 2 edges too far apart trigger

function, 179

find 2 patterns in eventual

sequence, 186, 187

find 2 patterns in immediate

sequence, 186, 187

find 3 patterns in eventual

sequence, 186

find 3 patterns in immediate

sequence, 186

find 4 patterns in eventual

sequence, 186

find 4 patterns in immediate

sequence, 186

Find edge AND pattern trigger

function, 178

Find edge trigger function, 178

Find glitch trigger function, 179

Find n-bit serial pattern, 182

Find Nth occurrence of an edge

trigger function, 179

find pattern, 186, 187

Find pattern n consecutive times,

182

Find pattern n times, 181

find pattern n times, 185

Find pattern occurring too late

after edge trigger function,

179

Find pattern occurring too soon

after edge trigger function,

179

Find pattern present/absent for &,

179

Find pattern present/absent for >

duration trigger function, 179

Find pattern trigger function, 178

Find pattern1 eventually followed

by pattern2, 182

find pattern1, or reset on pattern2,

185

Find pattern2 n times after

pattern1, before pattern3

occurs, 182

Contents

Main Agilent Technologies 16760A Logic Analyzer Page Page Page Choosing the Sampling Mode 43 Formatting Labels for Logic Analyzer Probes 57 3 Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements 69 Displaying Captured Data 94 Page Page The Eye Scan Tab 204 The Calibration Tab 210 Error Messages 211 Specifications and Characteristics 227 6 Concepts Understanding Logic Analyzer Triggering 240 Understanding State Mode Sampling Positions 256 Understanding Eye Scan Measurements 259 Page Page Page Page Probing and Sampling Mode Selection Steps Step 1. Connect logic analyzer to the device under test Step 2. Choose the sampling mode Page Next: Step 3. Format labels for the probed signals on page19 Step 3. Format labels for the probed signals Page Next: Timing Mode or State Mode Steps Step 4. Define the trigger condition Step 5. Run the measurement Step 6. Display the captured data Next: For More Information... on page31 Eye Scan Mode Steps Page Next: Step 6. Run the eye scan measurement on page28 Step 6. Run the eye scan measurement Step 7. Display the captured eye scan data Page For More Information... Page Page Page Probing the Device Under Test Using the E5378A Single-Ended Probe Page Using the E5379A Differential Probe Page Using the E5380A Mictor-Compatible Probe Using the E5382A Single-ended Flying Lead Probe Set Using an Analysis Probe Page Choosing the Sampling Mode Selecting the Timing Mode (Asynchronous Sampling) To select the timing mode You can also select the timing sampling mode in the Pod Assignment Dialog on page 175. To select the conventional/transitional configuration To specify the sample period The sample rate is the inverse of the sample period. Selecting the State Mode (Synchronous Sampling) To select the state mode You can also select the state sampling mode in the Pod Assignment Dialog on page 175. To select the state speed configuration To set up the sampling clock For the clock input signal that will be used: To automatically adjust sampling positions Page Page To manually adjust sampling positions In Either Timing Mode or State Mode To specify the trigger position To set acquisition memory depth To name an analyzer To turn an analyzer off or on Selecting the Eye Scan Mode To select the eye scan mode To select the eye scan mode speed configuration To set up the eye scan mode reference clock For the clock input signal that will be used: Formatting Labels for Logic Analyzer Probes To assign pods to the analyzer To set pod threshold voltages To set clock threshold voltages To assign probe channels to labels Page To import label names and assignments from a netlist To import label definitions from an ASCII file To export label definitions to an ASCII file To change the label polarity Changing the label polarity will have the following effects: Changing the label polarity does not affect: To reorder bits in a label To turn labels off or on Page Page Setting Up Triggers and Running Measurements Using Trigger Functions To select a trigger function To specify a label pattern event (Timing only) Label pattern events let you specify patterns or ranges on a bus. To specify a label edge event To break down a trigger function (timing or 200 Mb/s state only) Expanded trigger functions can be compressed back into their original form. To create a trigger function library (timing or 200 Mb/s state only) Once you have created a trigger function library with trigger functions, you can: Using Other Trigger Features To count time, states, or turn counting off pod to be left unassigned. To specify default storing Page To specify whether default storing is initially on or off Editing the Trigger Sequence (Timing or 200, 400 Mb/s State Only) To insert/replace/delete sequence levels To cut/copy-and-paste sequence levels To specify a level's goto or trigger action (timing or 200 Mb/s state only) To send e-mail when the trigger occurs (timing or 200 Mb/ s state only) Page To view a picture of the trigger sequence To clear the trigger sequence Editing Advanced Trigger Functions (Timing or 200 Mb/s State Only) To specify a duration or occurrence count for events To insert a store action (state mode) To insert timer actions/events To insert counter actions/events To insert flag actions/events Page To insert a "reset occurrence counter" action To group events To use named events Saving/Recalling Trigger Setups You can save a trigger setup within a session by using trigger save/ recall. To save a trigger setup To recall a trigger setup To clear the trigger save/recall list Running Measurements To start/stop measurements If nothing happens when you start a measurement To view the trigger status Displaying Captured Data To open Waveform or Listing displays To use other display tools Page If the captured data doesn't look correct If there are filtered data holes in display memory To display symbols for data values Page Using Symbols To load object file symbols To adjust symbol values for relocated code To create user-defined symbols To enter symbolic label values When entering label values in the trigger sequence: To create an ASCII symbol file General-purpose ASCII symbol files are created with text editing/ processing tools. To create a readers.ini file If a file only has an ELF section this will have no effect and the ELF This option must be specified in the Nsr section of the Readers.ini file: Page Page Printing/Exporting Captured Data Page Cross-Triggering To cross-trigger with another instrument Page Solving Logic Analysis Problems To test the logic analyzer hardware Page Saving and Loading Logic Analyzer Configurations Page Page Setting Up and Running Eye Scan Measurements To select channels for the eye scan To set the eye scan range and resolution To run an eye scan measurement To set advanced eye scan options To set up qualified eye scan measurements Page Page Page Page Page Page Page Page Page To comment on the eye scan settings Displaying Captured Eye Scan Data To open the Eye Scan display To select the channels displayed To scale the Eye Scan display To set Eye Scan display options Page Page Page To change the Eye Scan color scale Similarly, you can use the top slider bar or enter a number in the text To make measurements on the eye scan data Page Page Page Page Page Page To display information about the eye scan data Page To comment on the eye scan data Saving and Loading Captured Eye Scan Data Page Page The Sampling Tab The Sampling tab lets you choose between the logic analyzer's: Timing Mode When you select Timing Mode, the Timing Mode Controls area appears. How Samples are Stored in Transitional Timing State Mode When you select State Mode, the State Mode Controls area appears. Sampling Positions Dialog Sampling Positions Tab Page Page Page Page Page Page Page Page Eye Finder Setup Tab Eye Finder Advanced Settings Dialog. Some things to consider when selecting among the eye finder advanced settings are: File Info Tab Eye Scan Mode When you select Eye Scan Mode, the Eye Scan Mode Controls area appears. Page The Format Tab Pod Assignment Dialog The Trigger Tab Trigger Functions Subtab General Timing Trigger Functions Page General State Trigger Functions Page Page Advanced Trigger Functions Page Turbo State Trigger Functions 16760 State Trigger Functions Page 16760 Half Channel State Trigger Functions Settings Subtab Overview Subtab This tab gives a picture of the trigger sequence. Default Storing Subtab Status Subtab Save/Recall Subtab Page The Symbols Tab Page Symbols Selector Dialog Search Pattern Offset By Option Align to x Byte Option Symbol File Formats General-Purpose ASCII (GPA) Symbol File Format GPA Record Format Summary records. SECTIONS Use SECTIONS to define symbols for regions of memory, such as sections, segments, or classes. FUNCTIONS Use FUNCTIONS to define symbols for program functions, procedures or subroutines. VARIABLES You can specify symbols for variables using: If you specify only the address of a variable, the size is assumed to be 1 byte. SOURCE LINES Use SOURCE LINES to associate addresses with lines in your source files. START ADDRESS Comments The Eye Scan Tab Labels Subtab Scan Settings Subtab Advanced Subtab Page Qualifier Subtab Page The Calibration Tab All 16760A logic analyzer cards must be calibrated to ensure conformance to specifications. Error Messages Analyzer armed from another module contains no "Arm in from IMB" event Branch expression is too complex Page If the following sequence does not compile: This one may: If the following sequence does not compile: This one may: Page Cannot specify range on label with clock bits that span pod pairs Counter value checked as an event, but no increment action specified Goto action specifies an undefined level Hardware Initialization Failed Page No more Pattern resources available for this pod pair No Trigger action found in the trace specification Slow or Missing Clock Timer value checked as an event, but no start action specified Trigger function initialization failure Trigger inhibited during timing prestore Trigger Specification is too complex Combiner resource allocation guidelines: Waiting for Trigger Some strategies you can use when verifying or debugging trigger sequence levels are: Specifications and Characteristics E5378A Single-Ended Probe Specifications and E5378A Input Equivalent Circuit E5379A Differential Probe Specifications and E5379A Input Equivalent Circuit E5380A MICTOR-Compatible Probe Specifications and Characteristics E5380A Input Equivalent Circuit 1500 Mb/s Sampling Mode Specifications and 1250 Mb/s Sampling Mode Specifications and 800 Mb/s Sampling Mode Specifications and 400 Mb/s Sampling Mode Specifications and 200 Mb/s Sampling Mode Specifications and Conventional Timing Mode Specifications and Transitional Timing Mode Specifications and What is a Specification? What is a Characteristic? Page Page Understanding Logic Analyzer Triggering The Conveyor Belt Analogy Page Summary of Triggering Capabilities Sequence Levels Page Page Boolean Expressions Branches Edges Ranges Flags Occurrence Counters and Global Counters Timers Storage Qualification Page Strategies for Setting Up Triggers Trigger Functions Page Page Setting Up Complex Triggers Document Your Trigger Sequences Conclusions Understanding State Mode Sampling Positions Page Page Understanding Eye Scan Measurements